Charge-collection and single-event upset measurements at the ISIS neutron source

IEEE Transactions on Nuclear Science

Volumn 55, Issue 4, 2008, Pages 2126-2132

  Platt, Simon ^a   Török, Zoltán ^a,b   Frost, Chris D ^c   Ansell, Stuart ^c  

^a UNIVERSITY OF CENTRAL LANCASHIRE   (United Kingdom)

^b Leica Geosystems AG   (Switzerland)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Charge coupled devices; Dosimetry; Field programmable gate arrays; Neutron beams; Neutron radiation effects; Semiconductor device radiation effects

Indexed keywords

NEUTRON SOURCES;

CHARGE-COUPLED DEVICES; DOSIMETRY; FIELD PROGRAMMABLE GATE ARRAYS; NEUTRON BEAMS; NEUTRON RADIATION EFFECTS; SEMICONDUCTOR DEVICE RADIATION EFFECTS;

NEUTRONS;

EID: 53349156724     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.918518     Document Type: Conference Paper

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