Energy-resolved neutron seu measurements from 22 to 160 mev

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2519-2526

  Johansson, Karin ^a,c   Dyreklev, Peter ^c   Granbom, Bo ^b   Olsson, Nils ^b   Blomgren, Jan ^b   Renberg, P U ^a  

^a SAAB AB   (Sweden)

^b UPPSALA UNIVERSITY   (Sweden)

^c UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

NEUTRONS; RADIATION EFFECTS; SEMICONDUCTOR STORAGE;

ITERATIVE FOLDING METHOD; NEUTRON-INDUCED SINGLE-EVENT UPSET (NSEU); STATIC RANDOM ACCESS MEMORY (SRAM);

RANDOM ACCESS STORAGE;

EID: 0032313623     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736493     Document Type: Article

References (13)

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