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Volumn 205, Issue 7, 2010, Pages 2393-2403
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Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation
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Author keywords
Coatings; Digital image correlation (DIC); Finite element modeling (FEM); Focused ion beam (FIB); Residual stresses
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Indexed keywords
ANALYTICAL CALCULATION;
CO-SUBSTRATE;
COMPRESSIVE RESIDUAL STRESS;
CURVATURE MEASUREMENT;
DIGITAL IMAGE CORRELATIONS;
EXPERIMENTAL METHODOLOGY;
FIB MILLING;
FINITE ELEMENT MODELING;
FINITE ELEMENT MODELING (FEM);
FOCUSED ION BEAM (FIB);
FOCUSED ION BEAM MILLING;
HIGH RESOLUTION;
MATERIAL PROPERTY;
MATERIAL SURFACE;
MICROMETER SCALE;
MICROSCOPIC SCALE;
PVD COATINGS;
RELATIVE DISPLACEMENT;
RESIDUAL STRESS DETERMINATION;
RESIDUAL STRESS STATE;
SEM IMAGING;
STRAIN COMPONENTS;
STRAIN RELIEF;
STRESS EVALUATIONS;
TENSILE RESIDUAL STRESS;
THIN COATING;
TRENCH DEPTH;
BEAM PLASMA INTERACTIONS;
COATINGS;
FOCUSED ION BEAMS;
IMAGE ANALYSIS;
ION BOMBARDMENT;
IONS;
MILLING (MACHINING);
STRAIN MEASUREMENT;
STRESS ANALYSIS;
STRESS RELIEF;
TITANIUM NITRIDE;
TUNGSTEN CARBIDE;
X RAY DIFFRACTION;
RESIDUAL STRESSES;
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EID: 78649738321
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2010.09.033 Document Type: Article |
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Times cited : (169)
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References (22)
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