Large-deformation analysis in microscopic area using micro-moiré methods with a focused ion beam milling grating

Optics and Lasers in Engineering

Volumn 45, Issue 12, 2007, Pages 1157-1169

  Du, Hua ^a   Xie, Huimin ^a   Guo, Zhiqiang ^a   Pan, Bing ^a   Luo, Qiang ^b   Gu, Changzhi ^b   Jiang, Haichang ^c   Rong, Lijian ^c  

^a TSINGHUA UNIVERSITY   (China)

^b INSTITUTE OF PHYSICS   (China)

^c INSTITUTE OF METAL RESEARCH   (China)

Author keywords

Digital moir ; FIB milling grating; Large deformation measurement; SEM moir ; Shear band

Indexed keywords

DIFFRACTION GRATINGS; FOCUSED ION BEAMS; SCANNING ELECTRON MICROSCOPY; SHAPE MEMORY EFFECT; SHEAR BANDS; TITANIUM ALLOYS;

COMPRESSIVE TESTS; FOCUSED ION BEAM (FIB) MILLING METHOD; LARGE DEFORMATION MEASUREMENT;

MOIRE FRINGES;

EID: 34548648072     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2007.06.002     Document Type: Article

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