Probing nanotribological and electrical properties of organic molecular films with atomic force microscopy

Scanning

Volumn 32, Issue 5, 2010, Pages 257-264

  Park, Jeong Young ^a   Qi, Yabing ^b,c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Princeton University   (United States)

Author keywords

atomic force microscopy; charge transport; friction; polymer films; self assembled monolayer

Indexed keywords

CHARGE TRANSPORT; CHARGE TRANSPORT PROPERTIES; CONDUCTANCE MEASUREMENT; CONJUGATED MOLECULES; ELECTRICAL PROPERTY; HYBRID MOLECULES; KEY ISSUES; MOLECULAR DEFORMATIONS; MOLECULAR FILMS; MOLECULAR SCALE; NANOMECHANICAL PROPERTY; ORGANIC MOLECULAR FILMS; PACKING DENSITY; POLYMER-BLEND FILMS; SATURATED HYDROCARBONS; STRUCTURAL ASPECTS;

ATOMIC FORCE MICROSCOPY; ATOMS; BENDING (DEFORMATION); ELECTRIC PROPERTIES; ELECTRON ENERGY LEVELS; FRICTION; HYDROCARBONS; MOLECULES; ORGANIC POLYMERS; PHASE SEPARATION; PLASTIC FILMS; SELF ASSEMBLED MONOLAYERS; TRANSPORT PROPERTIES; TRIBOLOGY;

POLYMER FILMS;

HYDROCARBON; NANOFILM; POLYMER; SELF ASSEMBLED MONOLAYER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTANCE; ELECTRIC CONDUCTIVITY; ELECTRICITY; FRICTION; MOLECULAR MECHANICS; PRIORITY JOURNAL; TRANSPORT KINETICS;

EID: 78649255827     PISSN: 01610457     EISSN: 19328745     Source Type: Journal    
DOI: 10.1002/sca.20182     Document Type: Article

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