Analysis of electrical charging and discharging kinetics of different glasses under electron irradiation in a scanning electron microscope

Journal of Applied Physics

Volumn 108, Issue 9, 2010, Pages

  Fakhfakh, S ^a   Jbara, O ^b   Rondot, S ^b   Hadjadj, A ^b   Patat, J M ^b   Fakhfakh, Z ^a  

^a University of Sfax   (Tunisia)

^b UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE ACCUMULATION; CHARGE SPREADING; CHARGE STORAGE; CHEMICAL COMPOSITIONS; COMPARATIVE STUDIES; CURRENT DENSITY EFFECTS; DYNAMIC BEHAVIORS; ELECTRICAL CHARGING; ELECTRON BEAM IRRADIATION; EXPERIMENTAL CONDITIONS; INCIDENT BEAM ENERGY; PRIMARY BEAM ENERGIES; SCANNING ELECTRON MICROSCOPE; SECONDARY ELECTRON EMISSIONS; SELF REGULATION; SPACE CHARGES; TIME-RESOLVED;

CURRENT DENSITY; ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRONS; GLASS; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION;

ELECTRON IRRADIATION;

EID: 78549296987     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3499692     Document Type: Article

References (39)

1. Z. G. Song, C. K. Ong, and H. Gong, Appl. Surf. Sci. ASUSEE 0169-4332 119, 169 (1997). 10.1016/S0169-4332(97)00182-7
2. Z. G. Song, C. K. Ong, and H. Gong, J. Appl. Phys. JAPIAU 0021-8979 79, 7123 (1996). 10.1063/1.361427
3. Z. G. Song, H. Gong, and C. K. Ong, Mater. Sci. Eng., B MSBTEK 0921-5107 52, 12 (1998). 10.1016/S0921-5107(97)00140-2
4. S. Fakhfakh, O. Jbara, M. Belhaj, Z. Fakhfakh, A. Kallel, and E. I. Rau, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 197, 114 (2002). 10.1016/S0168-583X(02)01331-9 (Pubitemid 35410000)
5. S. Fakhfakh, O. Jbara, M. Belhaj, S. Rondot, D. Mouze, and Z. Fakhfakh, J. Appl. Phys. JAPIAU 0021-8979 104, 093704 (2008). 10.1063/1.3006012
6. H. Miyake, K. Nitta, S. Michizono, and Y. Saito, AIP Conf. Proc. APCPCS 0094-243X 1087, 645 (2009). 10.1063/1.3076880
7. B. Vincent, Word Intellectual property organisation, International Apllication Published Under the Patent Cooperation Treaty (PCT), International Publication Number: W0 99/36937, 22 July 1999.
8. J. Cazaux, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 244, 307 (2006). 10.1016/j.nimb.2005.10.006 (Pubitemid 43208705)
9. J. Cazaux, J. Appl. Phys. JAPIAU 0021-8979 85, 1137 (1999). 10.1063/1.369239
10. J. Cazaux, Eur. Phys. J. Appl. Phys. 15, 167 (2001). 10.1051/epjap: 2001178 1286-0042
11. M. Kotera and H. Suga, J. Appl. Phys. JAPIAU 0021-8979 63, 261 (1988). 10.1063/1.340285
12. K. Kanaya and S. Okayama, J. Phys. D JPAPBE 0022-3727 5, 43 (1972). 10.1088/0022-3727/5/1/308
13. J. Cazaux, J. Appl. Phys. JAPIAU 0021-8979 95, 731 (2004). 10.1063/1.1632015
14. M. Belhaj, S. Odof, K. Msellak, and O. Jbara, J. Appl. Phys. JAPIAU 0021-8979 88, 2289 (2000). 10.1063/1.1287131
15. J. Cazaux, J. Appl. Phys. JAPIAU 0021-8979 59, 1418 (1986). 10.1063/1.336493
16. V. Hulinsky k. Jurek and O. Gedeon, Mikrochim. Acta MIACAQ 0026-3672 13, 325 (1996).
17. M. Dapor and A. Miotello, Eur. Phys. J. Appl. Phys. 5, 143 (1999). 10.1051/epjap:1999122 1286-0042
18. J. Bigarŕ, S. Fayeulle, O. Paulhe, and D. Tŕheux, IEEE Annual Report: Conference on Electrical Insulation and Dielectric Phenomena, 19-22 October 1997, Minneapolis, MN, pp. 101-104.
19. S. Fakhfakh, O. Jbara, M. Belhaj, Z. Fakhfakh, A. Kallel, and E. Rau, Eur. Phys. J.: Appl. Phys. EPAPFV 1286-0042 21, 137 (2003). 10.1051/epjap: 2003001
20. M. Chopinet, D. Lizarazu, and C. Rocanìre, C. R. Chim. CRCOCR 1631-0748 5, 939 (2002).
21. M. A. Stevens Kalceff, G. J. Thorogood, and K. T. Short, J. Appl. Phys. JAPIAU 0021-8979 86, 205 (1999). 10.1063/1.370718
22. O. Jbara, M. Belhaj, S. Odof K. Msellak, E. Rau, and M. Andrianov, Rev. Sci. Instrum. RSINAK 0034-6748 72, 1788 (2001). 10.1063/1.1344596
23. O. Jbara, J. Cazaux, and P. Trebbia, J. Appl. Phys. JAPIAU 0021-8979 78, 868 (1995). 10.1063/1.360277
24. D. Braga, Thesis, Université Paris-Sud 11, 2003.
25. V. V. Aristov, L. S. Kokhanchik, K. P. Meyer, and H. Blumtritt, Phys. Status Solidi A PSSABA 0031-8965 78, 229 (1983). 10.1002/pssa.2210780127
26. E. I. Rau, E. N. Evstafeva, and M. V. Andrianov, Phys. Solid State PSOSED 1063-7834 50, 621 (2008). 10.1134/S1063783408040057
27. A. C. Wright, J. Non-Cryst. Solids JNCSBJ 0022-3093 106, 1 (1988). 10.1016/0022-3093(88)90218-9
28. I. G. Austin and N. F. Mott, Adv. Phys. ADPHAH 0001-8732 18, 41 (1969). 10.1080/00018736900101267
29. J. Cazaux, Scanning SCNNDF 0161-0457 26, 181 (2004). 10.1002/sca. 4950260406
30. N. Itoh and A. Stoneham, Materials Modifications by Electronic Excitations (Cambridge University Press, UK, 2001).
31. J. H. Wintle, J. Appl. Phys. JAPIAU 0021-8979 81, 2682 (1997). 10.1063/1.363971
32. A. Shih, J. Yater, C. Hor, and R. Abrams, Appl. Surf. Sci. ASUSEE 0169-4332 111, 251 (1997). 10.1016/S0169-4332(96)00729-5
33. H. Chen, H. Gong, and C. K. Ong, J. Phys.: Condens. Matter JCOMEL 0953-8984 7, 1129 (1995). 10.1088/0953-8984/7/6/014
34. T. Thome, D. Braga, and G. Blaise, J. Appl. Phys. JAPIAU 0021-8979 95, 2619 (2004). 10.1063/1.1643782
35. G. Blaise, F. Pesty, and P. Garoche, J. Appl. Phys. JAPIAU 0021-8979 105, 034101 (2009). 10.1063/1.3073945
36. A. Boughariou, O. Hachicha, A. Kallel, and G. Blaise, Nucl. Instrum. Methods Phys. Res. B NIMBEU 0168-583X 240, 697 (2005). 10.1016/j.nimb.2005.06. 006 (Pubitemid 41562844)
37. J. Cazaux, Microsc. Microanal. MIMIF7 1431-9276 10, 670 (2004). 10.1017/S1431927604040619 (Pubitemid 40068252)
38. O. Gedeon, K. Jurek, and V. Hulinsky, J. Non-Cryst. Solids JNCSBJ 0022-3093 246, 1 (1999). 10.1016/S0022-3093(99)00083-6
39. H. A. Bethe and J. Ashkin, Experimental Nuclear Physics (Wiley, New York, 1953).