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Volumn 86, Issue 1, 1999, Pages 205-208
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Charge trapping and defect segregation in quartz
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001175762
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.370718 Document Type: Article |
Times cited : (30)
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References (16)
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