Tunable visible and near-IR emission from sub-10 nm etched single-crystal Si nanopillars

Nano Letters

Volumn 10, Issue 11, 2010, Pages 4423-4428

  Walavalkar, Sameer S ^a   Hofmann, Carrie E ^a   Homyk, Andrew P ^a   Henry, M David ^a   Atwater, Harry A ^a   Scherer, Axel ^a  

^a California Institute of Technology   (United States)

Author keywords

photoluminescence; plasma etching; quantum effects; Silicon nanowires; strain induced behavior

Indexed keywords

BLUE SHIFT; COMPLEMENTARY METAL OXIDE SEMICONDUCTORS; CYLINDRICAL STRUCTURE; EMISSION CHARACTERISTICS; LASER STRUCTURES; NANOPILLARS; NEAR-IR; PILLAR DIAMETERS; QUANTUM CONFINEMENT EFFECTS; QUANTUM EFFECTS; SILICON DEVICES; SILICON NANOWIRES; SINGLE-CRYSTAL SI; THERMAL OXIDATION PROCESS; TIGHT BINDING METHODS;

LIGHT EMITTING DIODES; METALLIC COMPOUNDS; MOS DEVICES; NANOWIRES; OXIDATION; PHOTOLUMINESCENCE; PLASMA ETCHING; QUANTUM ELECTRONICS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICES; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

SILICON WAFERS;

NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; EQUIPMENT; EQUIPMENT DESIGN; ILLUMINATION; INFRARED RADIATION; INSTRUMENTATION; LUMINESCENCE; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INFRARED RAYS; LIGHTING; LUMINESCENT MEASUREMENTS; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SILICON; SURFACE PROPERTIES;

EID: 78449285744     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl102140k     Document Type: Article

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