Spectroscopy of individual silicon nanowires

Applied Physics Letters

Volumn 82, Issue 16, 2003, Pages 2616-2618

  Qi, Jifa ^a   Belcher, Angela M ^a   White, John M ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ELECTRON ENERGY LEVELS; LIGHT POLARIZATION; PHOTOLUMINESCENCE; SILICA; SILICON WAFERS; SPECTROSCOPIC ANALYSIS;

SILICON NANOWIRES;

NANOSTRUCTURED MATERIALS;

EID: 0037545955     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1569982     Document Type: Article

References (27)

1. L. T. Canham, Appl. Phys. Lett. 57, 1046 (1990).
2. V. Lehman and U. Gsele, Appl. Phys. Lett. 58, 865 (1991).
3. J. P. Proot, C. Delerue, and G. Allan, Appl. Phys. Lett. 61, 1948 (1992).
4. F. Koch, V. Petrova-Koch, and T. Muschik, J. Lumin. 57, 271 (1993).
5. S. M. Prokes, Appl. Phys. Lett. 62, 3244 (1993).
6. Y. Kanemitsu, J. Lumin. 83-84, 283 (1999).
7. M. Morales and C. M. Lieber, Science 279, 208 (1998).
8. D. P. Yu, C. S. Lee, I. Bello, X. S. Sun, Y. H. Tang, G. W. Zhou, Z. G. Bai, Z. Zhang, and S. Q. Feng, Solid State Commun. 105, 403 (1998).
9. Y. F. Zhang, Y. H. Zhang, N. Wang, D. P. Yu, C. S. Lee, I. Bello, and S. T. Lee, Appl. Phys. Lett. 72, 1835 (1998).
10. S. T. Lee, N. Wang, and C. S. Lee, Mater. Sci. Eng., A 286, 16 (2000).
11. J. Qi and Y. Masumoto, Mater. Res. Bull. 36, 1407 (2001).
12. D. P. Yu, Q. L. Hang, Y. Ding, H. Z. Zhang, Z. G. Bai, J. J. Wang, Y. H. Zou, W. Qian, G. C. Xiong, and S. Q. Feng, Appl. Phys. Lett. 73, 3076 (1998).
13. Z. G. Bai, D. P. Yu, J. J. Wang, Y. H. Zou, W. Qian, J. S. Fu, S. Q. Feng, J. Xu, and L. P. You, Mater. Sci. Eng., B 72, 117 (2000).
14. N. Ozaki, Y. Ohno, and S. Takeda, Mater. Res. Soc. Symp. Proc. 588, 99 (2000).
15. J. D. Holmes, K. P. Johnston, R. C. Doty, and B. A. Korge, Science 287, 1471 (2000).
16. N. R. B. Coleman, N. OSullilvan, K. M. Ryan, T. A. Crowley, M. A. Morris, T. R. Spalding, D. C. Steytler, and J. D. Holmes, J. Am. Chem. Soc. 123, 7010 (2001).
17. S. A. Empedocles, D. J. Norris, and M. G. Bawendi, Phys. Rev. B 77, 3873 (1996).
18. F. Vouilloz, D. Y. Oberli, M. A. Dupertuis, A. Gustafsson, F. Reinhardt, and E. Kapon, Phys. Rev. B 57, 12378 (1998).
19. J. Hasen, L. N. Pfeiffer, A. Pinczuk, S. He, K. W. West, and B. S. Dennis, Nature (London) 390, 54 (1997).
20. M. S. Gudiksen, J. Wang, and C. M. Lieber, J. Phys. Chem. B 106, 4036 (2002).
21. H. Akiyama, T. Someya, and H. Sakaki, Phys. Rev. B 53, R4229 (1996).
22. J. Wang, M. S. Gudiksen, X. Duan, Y. Cui, and C. M. Lieber, Science 293, 1455 (2001).
23. L. D. Landau and E. M. Lifshitz, Electrodynamics of Continuous Media (Pergamon, Oxford, 1960).
24. J. Kudrna, F. Trojánek, I. Pelant, S. Sanáš, V. Kohlová, and P. Malý, Thin Solid Films 276, 58 (1996).
25. X. Zhao, O. Schoenfeld, S. Komuro, Y. Aoyagi, and T. Sugano, Phys. Rev. B 50, 18654 (1994).
26. T. Matsumoto, T. Futagi, H. Mimura, and Y. Kanemitsu, Phys. Rev. B 47, 13876 (1993).
27. Y. Kanemitsu, Phys. Rev. B 49, 16845 (1994).