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Volumn 95, Issue 1, 2011, Pages 211-214

Reduction of amorphous incubation layer by HCl addition during deposition of microcrystalline silicon by hot-wire chemical vapor deposition

Author keywords

Amorphous incubation layer; Hot wire chemical vapor deposition; Microcrystalline silicon

Indexed keywords

CRYSTALLINE SILICON FILMS; CRYSTALLINITIES; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GLASS SUBSTRATES; GRAIN SIZE; GROWTH STAGES; HCL GAS; HOT WIRE CHEMICAL VAPOR DEPOSITION; HYDROGENATED MICROCRYSTALLINE SILICON; INCUBATION LAYER; INITIAL STAGES; LOW TEMPERATURES; SILICON DEPOSITION; SILICON FILMS;

EID: 78149359276     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.04.021     Document Type: Conference Paper
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.