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Volumn 11, Issue 4, 2010, Pages
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Characterization of Bi and Fe co-doped PZT capacitors for FeRAM
d
Accelrys KK
(Japan)
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Author keywords
Doping effects; Fatigue; Ferroelectric; Film; Oxides; Polarization; PUND; PZT
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Indexed keywords
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EID: 78149348797
PISSN: 14686996
EISSN: None
Source Type: Journal
DOI: 10.1088/1468-6996/11/4/044402 Document Type: Article |
Times cited : (24)
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References (30)
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