SCOPUS 정보 검색 플랫폼

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 40, Issue 4 A, 2001, Pages

(Pb, La)(Zr, Ti)O3 film grain-boundary conduction with SrRuO3 top electrodes

(3) Cross, J S a Tomotani, M a Kotaka, Y a

a FUJITSU LABORATORIES LTD (Japan)

Author keywords

Anneal; Diffusion; Excess; Leakage; Pb; PZT; SIMS; Sr; SrRuO3

Indexed keywords

ANNEALING; CAPACITORS; CRYSTALLIZATION; ELECTRODES; GRAIN BOUNDARIES; INTERDIFFUSION (SOLIDS); LEAD; SECONDARY ION MASS SPECTROMETRY; STRONTIUM COMPOUNDS; X RAY SPECTROSCOPY;

GRAIN-BOUNDARY CONDUCTION;

FERROELECTRIC THIN FILMS;

EID: 0035301719 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.l346 Document Type: Article

Times cited : (21)

References (14)

1
- 0032650259
- (1999) Jpn. J. Appl. Phys. , vol.38
- Cross, J.S.¹ Fujiki, M.² Tsukada, M.³ Matsuura, K.⁴ Otani, S.⁵

2
- 0033315131
- (1999) Integr. Ferroelectr. , vol.25 , pp. 265
- Cross, J.S.¹ Fujiki, M.² Tsukada, M.³ Matsuura, K.⁴ Otani, S.⁵ Tomotani, M.⁶ Kataoka, Y.⁷ Kotaka, Y.⁸ Goto, Y.⁹

3
- 0032613359
- (1999) Appl. Phys. Lett. , vol.75 , pp. 1790
- Stolichnov, I.¹ Tagantsev, A.² Setter, N.³ Cross, J.S.⁴ Tsukada, M.⁵

4
- 0031198725
- (1997) Jpn. J. Appl. Phys. , vol.36
- Kushida-Abdelghafar, K.¹ Miki, H.² Yano, F.³ Fujisaki, Y.⁴

5
- 0032131040
- (1998) Jpn. J. Appl. Phys. , vol.37 , pp. 4533
- Ling, Y.-C.¹ Lee, J.-H.² Liu, K.-S.³ Tseng, T.-F.⁴ Tseng, Y.-K.⁵ Lin, I.-N.⁶

6
- 0033100097
- (1999) J. Mater. Res. , vol.14 , pp. 1018
- Kim, S.-H.¹ Hong, J.G.² Streiffer, S.K.³ Kingon, A.I.⁴

7
- 0000279866
- (1988) Phys. Rev. B , vol.37 , pp. 5107
- Ganguly, P.¹ Hedge, M.S.²

8
- 0029378981
- (1995) Solid State Commun. , vol.95 , pp. 581
- Fu, W.¹ Ijdo, D.J.W.²

9
- 0026989889
- (1992) Physica C , vol.204 , pp. 194
- Itoh, M.¹ Sawada, T.² Kim, I.-S.³ Inaguma, Y.⁴ Nakamura, T.⁵

10
- 0000757659
- (2000) J. Appl. Phys. , vol.87 , pp. 1925
- Stolichnov, I.¹ Tagantsev, A.² Setter, N.³ Okhonin, S.⁴ Fazan, P.⁵ Cross, J.S.⁶ Tsukada, M.⁷

11
- 0033221937
- (1999) J. Mater. Res. , vol.14 , pp. 4366
- Cross, J.S.¹ Fujiki, M.² Tsukada, M.³ Kotaka, Y.⁴ Goto, Y.⁵

12
- 0004790245
- (1999) Integr. Ferroelectr. , vol.25 , pp. 971
- Fujiki, M.¹ Cross, J.S.² Tsukada, M.³ Ashida, T.⁴ Matsuura, K.⁵ Otani, S.⁶

13
- 0032003430
- (1998) J. Am. Ceram. Soc. , vol.81 , pp. 315
- Horita, T.¹ Sakai, N.² Kawada, T.³ Yokokawa, H.⁴ Dokiya, M.⁵

14
- 0001054986
- (1999) J. Appl. Phys. , vol.85 , pp. 1069
- Kushida-Abdelghafar, K.¹ Hiratani, M.² Fujisaki, Y.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.