Capacitor test simulation of retention and imprint characteristics for ferroelectric memory operation

Integrated Ferroelectrics

Volumn 16, Issue 1-4, 1997, Pages 63-76

  Traynor, S D ^a   Hadnagy, T D ^a   Kammerdiner, L ^a  

^a Ramtron International Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; FERROELECTRIC DEVICES; THERMAL STRESS;

FERROELECTRIC MEMORY DEVICES;

DATA STORAGE EQUIPMENT;

EID: 0031332801     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589708013030     Document Type: Article

References (7)

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