Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films: A rapid evaluation method for c-domain volume

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 44, Issue 24-27, 2005, Pages

  Nishida, Ken ^a   Osada, Minoru ^b   Wada, Syunshuke ^a   Okamoto, Shoji ^c   Ueno, Risako ^c   Funakubo, Hiroshi ^c   Katoda, Takashi ^a  

^a KOCHI UNIVERSITY OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Domain distribution; Pbzrxti1 xo3 (pzt); Raman scattering; Thin film

Indexed keywords

CHARACTERIZATION; EPITAXIAL GROWTH; LEAD COMPOUNDS; NONDESTRUCTIVE EXAMINATION; THIN FILMS;

DOMAIN DISTRIBUTION; PBZRXTI1-XO3 (PZT);

RAMAN SPECTROSCOPY;

EID: 32044439604     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.44.L827     Document Type: Article

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