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Volumn 257, Issue 2, 2010, Pages 481-486

Effect of sputtering anisotropic ejection on the optical properties and residual stress of Nb 2 O 5 thin films

Author keywords

Ejection angle; Ion beam sputtering deposition; Niobium pentoxide; Residual stress; Thin film

Indexed keywords

ANISOTROPY; ION BEAMS; NIOBIUM OXIDE; REFRACTIVE INDEX; RESIDUAL STRESSES; SILICON WAFERS; SPUTTERING; SUBSTRATES; SURFACE ROUGHNESS;

EID: 78049528783     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.07.017     Document Type: Article
Times cited : (6)

References (30)
  • 28
    • 11144357673 scopus 로고    scopus 로고
    • H. Ehlers, K. Becker, R. Beckmann, N. Beermann, U. Brauneck, P. Fuhrberg, D. Gäbler, S. Jakobs, N. Kaiser, M. Kennedy, F. König, S. Laux, J.C. Müller, B. Rau, W. Riggers, D. Ristau, D. Schäfer, O. Stenzel, H.A. Macleod
    • H. Ehlers, K. Becker, R. Beckmann, N. Beermann, U. Brauneck, P. Fuhrberg, D. Gäbler, S. Jakobs, N. Kaiser, M. Kennedy, F. König, S. Laux, J.C. Müller, B. Rau, W. Riggers, D. Ristau, D. Schäfer, O. Stenzel, H.A. Macleod, Proc. of SPIE, vol. 5250 2004 646
    • (2004) Proc. of SPIE, Vol. 5250 , pp. 646


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.