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Volumn 255, Issue 5 PART 2, 2008, Pages 2890-2895

Influence of ejection angle on residual stress and optical properties of sputtering Ta 2 O 5 thin films

Author keywords

Ion beam sputtering deposition; Residual stress; Tantalum pentaoxide; Thin film

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; ION BEAMS; MICROSTRUCTURE; REFRACTIVE INDEX; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SPUTTERING; SUBSTRATES; TANTALUM OXIDES; THIN FILMS; X RAY DIFFRACTION;

EID: 56949105571     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.08.049     Document Type: Article
Times cited : (14)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.