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Volumn 255, Issue 5 PART 2, 2008, Pages 2890-2895
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Influence of ejection angle on residual stress and optical properties of sputtering Ta 2 O 5 thin films
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Author keywords
Ion beam sputtering deposition; Residual stress; Tantalum pentaoxide; Thin film
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Indexed keywords
AMORPHOUS FILMS;
ATOMIC FORCE MICROSCOPY;
ION BEAMS;
MICROSTRUCTURE;
REFRACTIVE INDEX;
RESIDUAL STRESSES;
SCANNING ELECTRON MICROSCOPY;
SILICON WAFERS;
SPUTTERING;
SUBSTRATES;
TANTALUM OXIDES;
THIN FILMS;
X RAY DIFFRACTION;
BK7 GLASS;
DEPOSITED FILMS;
EXTINCTION COEFFICIENTS;
ION BEAM SPUTTERING DEPOSITION;
METAL TARGET;
TA2O5 THIN FILMS;
TANTALUM PENTAOXIDE;
X-RAY DIFFRACTION METHOD;
OPTICAL FILMS;
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EID: 56949105571
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2008.08.049 Document Type: Article |
Times cited : (14)
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References (21)
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