Improvements in the determination of extinction coefficients of a thin film using an envelope method

Journal of Optics A: Pure and Applied Optics

Volumn 7, Issue 10, 2005, Pages 599-603

  Kar, Meenakshi ^a   Verma, Bhullan S ^a,b  

^a NATIONAL PHYSICAL LABORATORY   (India)

^b National Physical Laboratory ^*  (India)

Author keywords

Envelope method; Extinction coefficient; Optical constants; Refractive index; Thin film; Variational method

Indexed keywords

ALGORITHMS; LIGHT EXTINCTION; REFRACTIVE INDEX; SUBSTRATES;

ENVELOPE METHOD; EXTINCTION COEFFICIENT (K);

THIN FILMS;

EID: 25144487751     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/7/10/012     Document Type: Article

References (17)

1. Lyashenko S P and Miloslavskii V K 1964 A simple method for the determination of the thickness and optical constants of semiconducting and dielectric layers Opt. Spectrosc. 16 80-1
2. Valeev A S 1964 Determination of the optical constants of weakly absorbing thin films Opt. Spectrosc. 15 269-74
3. Manifacier J C, Gasiot J and Fillard J P 1976 A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film J. Phys. E: Sci. Instrum. 9 1002-4
4. Swanepoel R 1983 Determination of the thickness and optical constants of amorphous silicon J. Phys. E: Sci. Instrum. 16 1214-22
5. Meredith P, Buller G S and Walker A C 1993 Improved method for determining the optical constants of thin films and its application to molecular-beam-deposited polycrystalline layers Appl. Opt. 32 5619-27
6. Chiao S-C, Bovard B G and Macleod H A 1995 Optical-constant calculation over an extended spectral region: application to titanium oxide film Appl. Opt. 34 7355-60
7. Cisneros Jorge I 1998 Optical characterization of dielectric and semiconductor thin films by use of transmission data Appl. Opt. 37 5262-70
8. González-Leal J M, Prieto-Alcón R, Angel J A, Minkov D A and Márquez E 2002 Influence of substrate absorption on the optical and geometrical characterization of thin dielectric films Appl. Opt. 41 7300-8
9. Minkov D A 1989 Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum J. Phys. D: Appl. Phys. 22 1157-61
10. Kushev D B, Zheleva N N, Demakopoulon Y and Siapkas D 1986 A new method for the determination of the thickness, the optical constants and the relaxation time of weakly absorbing semiconducting thin films Infrared Phys. 26 385-93
11. Rusli and Amaratunga G A J 1995 Determination of the optical constants and thickness of thin films on slightly absorbing substrates Appl. Opt. 34 7914-24
12. Smith S D 1958 Design of multilayer filters by considering two effective interfaces J. Opt. Soc. Am. 48 43-50
13. Macleod H A 1986 Thin Film Optical Filters (Bristol: Hilger) p 52
14. Wang You and Miyagi M 1997 Simultaneous measurement of optical constants of dispersive material at visible and infrared wavelengths Appl. Opt. 36 877-84
15. Abelès F and Thèye M L 1966 Méthode de calcul des constantes optiques des couches minces absorbantes à partir des mesures de réflexion et de transmission Surf. Sci. 5 325-31
16. Liddell H M 1980 Computer-Aided Techniques for the Design of Multilayer Filters (Bristol: Hilger) p 123
17. Palik E D (ed) 1985 Handbook of Optical Constants of Solids (New York: Academic)