SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 109, Issue 4, 2009, Pages 291-295

Improve performance of scanning probe microscopy by balancing tuning fork prongs

(4) Ng, Boon Ping a,b Zhang, Ying a Wei Kok, Shaw a Chai Soh, Yeng b

a SINGAPORE INSTITUTE OF MANUFACTURING TECHNOLOGY (Singapore)

b NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

Q factor; Scanning probe microscope; Tuning fork

Indexed keywords

ANALYTICAL MODELS; ATOMIC FORCE MICROSCOPES; EXPERIMENTAL DATUM; MODEL FITS; Q-FACTOR; SCANNING PROBE MICROSCOPE; SCANNING PROBES; TOPOGRAPHIC IMAGES; TUNING FORK;

MICROSCOPES; Q FACTOR MEASUREMENT; SCANNING; SCANNING PROBE MICROSCOPY; TUNING;

PROBES;

EID: 61849166169 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2008.11.029 Document Type: Article

Times cited : (25)

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