Application of electron optical techniques to the study of amorphous materials

Philosophical Magazine

Volumn 90, Issue 35-36, 2010, Pages 4647-4660

  Howie, A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

amorphous solids; coherence volume; electron diffraction; electron microscopy

Indexed keywords

AMORPHOUS SOLIDS; AMORPHOUS STRUCTURES; ANGSTROM RESOLUTION; ANGULAR CORRELATIONS; COHERENCE VOLUME; DATA PRESENTATION; DIFFRACTION ANALYSIS; DIRECT IMAGING; ELECTRON PROBE; ELECTRON TOMOGRAPHY; ENERGY-LOSS SPECTRUM; FINE STRUCTURES; FLUCTUATION MICROSCOPY; NANODIFFRACTION PATTERNS; OPTICAL TECHNIQUE; RADIAL DISTRIBUTION FUNCTIONS; SPATIAL VARIATIONS; STATISTICAL REPRESENTATIONS; TRANSMISSION ELECTRON MICROSCOPE;

COHERENT SCATTERING; DISTRIBUTION FUNCTIONS; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONS; ENERGY DISSIPATION; PROBES; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS MATERIALS;

EID: 77958617016     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786431003636105     Document Type: Conference Paper

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