메뉴 건너뛰기




Volumn 13, Issue 12, 2010, Pages

Improved resistive switching properties of solution processed ti O 2 thin films

Author keywords

[No Author keywords available]

Indexed keywords

BOTTOM ELECTRODES; COMPLIANCE CURRENT; CYCLING ENDURANCE; HIGH-RESISTANCE STATE; LOW TEMPERATURES; LOW-RESISTANCE STATE; ON/OFF RATIO; OXYGEN VACANCY DEFECTS; PHYSICAL MODEL; RELIABILITY AND STABILITY; RESISTIVE SWITCHING; SET OPERATION; SWITCHING PROPERTIES;

EID: 77958466528     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3494433     Document Type: Article
Times cited : (9)

References (27)
  • 5
    • 36048964246 scopus 로고    scopus 로고
    • Anode-interface localized filamentary mechanism in resistive switching of Ti O2 thin films
    • DOI 10.1063/1.2749846
    • K. M. Kim, B. J. Choi, Y. C. Shin, S. Choi, and C. S. Hwang, Appl. Phys. Lett. APPLAB 0003-6951, 91, 12907 (2007). 10.1063/1.2749846 (Pubitemid 350092117)
    • (2007) Applied Physics Letters , vol.91 , Issue.1 , pp. 012907
    • Kim, K.M.1    Choi, B.J.2    Shin, Y.C.3    Choi, S.4    Hwang, C.S.5
  • 7
    • 36549006435 scopus 로고    scopus 로고
    • High speed resistive switching in PtTi O2 TiN film for nonvolatile memory application
    • DOI 10.1063/1.2818691
    • C. Yoshida, K. Tsunoda, H. Noshiro, and Y. Sugiyama, Appl. Phys. Lett. APPLAB 0003-6951, 91, 223510 (2007). 10.1063/1.2818691 (Pubitemid 350191677)
    • (2007) Applied Physics Letters , vol.91 , Issue.22 , pp. 223510
    • Yoshida, C.1    Tsunoda, K.2    Noshiro, H.3    Sugiyama, Y.4
  • 10
    • 0000748226 scopus 로고    scopus 로고
    • APPLAB 0003-6951,. 10.1063/1.126464
    • S. Q. Liu, J. Wu, and A. Ignatiev, Appl. Phys. Lett. APPLAB 0003-6951, 76, 2749 (2000). 10.1063/1.126464
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 2749
    • Liu, S.Q.1    Wu, J.2    Ignatiev, A.3
  • 13
    • 65249091964 scopus 로고    scopus 로고
    • LANGD5 0743-7463,. 10.1021/la804267n
    • C. Lee, I. Kim, W. Choi, S. Kim, and J. Cho, Langmuir LANGD5 0743-7463, 25, 4274 (2009). 10.1021/la804267n
    • (2009) Langmuir , vol.25 , pp. 4274
    • Lee, C.1    Kim, I.2    Choi, W.3    Kim, S.4    Cho, J.5
  • 17
    • 34250327548 scopus 로고    scopus 로고
    • Coexistence of bipolar and unipolar resistive switching behaviors in a Pt TiO2 Pt stack
    • DOI 10.1149/1.2742989
    • D. S. Jeong, H. Schroeder, and R. Waser, Electrochem. Solid-State Lett. ESLEF6 1099-0062, 10, G51 (2007). 10.1149/1.2742989 (Pubitemid 46920043)
    • (2007) Electrochemical and Solid-State Letters , vol.10 , Issue.8
    • Jeong, D.S.1    Schroeder, H.2    Waser, R.3
  • 18
    • 38649121160 scopus 로고    scopus 로고
    • 2 thin films
    • DOI 10.1016/j.tsf.2007.06.147, PII S0040609007010929
    • K. P. Biju and M. K. Jain, Thin Solid Films THSFAP 0040-6090, 516, 2175 (2008). 10.1016/j.tsf.2007.06.147 (Pubitemid 351174192)
    • (2008) Thin Solid Films , vol.516 , Issue.8 , pp. 2175-2180
    • Biju, K.P.1    Jain, M.K.2
  • 25
    • 0000499978 scopus 로고    scopus 로고
    • Current-induced local oxidation of metal films: Mechanism and quantum-size effects
    • DOI 10.1063/1.122413, PII S000369519804741X
    • T. Schmidt, R. Martel, R. L. Sandstrom, and P. Avouris, Appl. Phys. Lett. APPLAB 0003-6951, 73, 2173 (1998). 10.1063/1.122413 (Pubitemid 128672104)
    • (1998) Applied Physics Letters , vol.73 , Issue.15 , pp. 2173-2175
    • Schmidt, T.1    Martel, R.2    Sandstrom, R.L.3    Avouris, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.