메뉴 건너뛰기




Volumn 94, Issue 12, 2010, Pages 2238-2243

Formation and photoluminescence of Si quantum dots in SiO 2/Si3N4 hybrid matrix for all-Si tandem solar cells

Author keywords

Nanocrystal growth; Photoluminescence; Silicon quantum dots; Tandem solar cells

Indexed keywords

ANNEALING METHODS; BAND GAPS; BARRIER LAYERS; BARRIER THICKNESS; CORE-SHELL MODEL; HYBRID MATRIX; NANOCRYSTAL GROWTH; PEAK ENERGY; PHOTOVOLTAIC APPLICATIONS; PL MEASUREMENTS; POST-DEPOSITION; QUARTZ SUBSTRATE; RADIATIVE RECOMBINATION PROCESS; RAMAN MEASUREMENTS; SI NANOCRYSTAL; SI QUANTUM DOT; SILICON QUANTUM DOTS; SILICON RICH OXIDES; SYNTHESIZED MATERIALS; TANDEM SOLAR CELLS; XRD;

EID: 77957687063     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2010.07.018     Document Type: Article
Times cited : (59)

References (22)
  • 1
    • 67649413744 scopus 로고    scopus 로고
    • Progress with silicon-based tandem cells using silicon quantum dots in a dielectric matrix
    • Milan, Italy
    • M.A. Green, et al., Progress with silicon-based tandem cells using silicon quantum dots in a dielectric matrix, in: Proceedings of the 22nd EU PVSEC, Milan, Italy, 2007, pp. 14.
    • (2007) Proceedings of the 22nd EU PVSEC , pp. 1-4
    • Green, M.A.1
  • 2
    • 34548548376 scopus 로고    scopus 로고
    • Progress with all-silicon tandem cells based on silicon quantum dots in a dielectric matrix
    • Dresden
    • M.A. Green, et al., Progress with all-silicon tandem cells based on silicon quantum dots in a dielectric matrix, in: Proceedings of the 21st EU PVSEC, Dresden, 2006, pp. 1014.
    • (2006) Proceedings of the 21st EU PVSEC , pp. 10-14
    • Green, M.A.1
  • 3
    • 78049432053 scopus 로고    scopus 로고
    • Impacts of post-metallisation processes on the electrical and photovoltaic properties of Si quantum dot solar cells
    • in press, doi:10.1007/s11671-010-9707-x
    • D. Di, I. Perez-Wurfl, A. Gentle, D-H. Kim, X. Hao, L. Shi, G. Conibeer, M.A. Green, Impacts of post-metallisation processes on the electrical and photovoltaic properties of Si quantum dot solar cells, Nanoscale Res. Lett., in press, doi:10.1007/s11671-010-9707-x.
    • Nanoscale Res. Lett.
    • Di, D.1    Perez-Wurfl, I.2    Gentle, A.3    Kim, D.-H.4    Hao, X.5    Shi, L.6    Conibeer, G.7    Green, M.A.8
  • 5
    • 70350074329 scopus 로고    scopus 로고
    • Si nanocrystal pin diodes fabricated on quartz substrates for third generation solar cell applications
    • I. Perez-Wurfl, X. Hao, A. Gentle, D-H. Kim, G. Conibeer, and M.A. Green Si nanocrystal pin diodes fabricated on quartz substrates for third generation solar cell applications Appl. Phys. Lett. 95 2009 153506
    • (2009) Appl. Phys. Lett. , vol.95 , pp. 153506
    • Perez-Wurfl, I.1    Hao, X.2    Gentle, A.3    Kim, D.-H.4    Conibeer, G.5    Green, M.A.6
  • 6
    • 0000345863 scopus 로고
    • Structure and grain boundary defects of recrystallized silicon films prepared from amorphous silicon deposited using disilane
    • S. Hasegawa, S. Watanabe, T. Inokuma, and Y. Kurata Structure and grain boundary defects of recrystallized silicon films prepared from amorphous silicon deposited using disilane J. Appl. Phys. 77 1995 1938 1947
    • (1995) J. Appl. Phys. , vol.77 , pp. 1938-1947
    • Hasegawa, S.1    Watanabe, S.2    Inokuma, T.3    Kurata, Y.4
  • 9
    • 37149012014 scopus 로고    scopus 로고
    • Fabrication and characterization of tin-based nanocrystals
    • S. Huang, E-C. Cho, G. Conibeer, and M.A. Green Fabrication and characterization of tin-based nanocrystals J. Appl. Phys. 102 2007 114304
    • (2007) J. Appl. Phys. , vol.102 , pp. 114304
    • Huang, S.1    Cho, E.-C.2    Conibeer, G.3    Green, M.A.4
  • 10
    • 0020193387 scopus 로고
    • 4, and other phenacite-type compounds
    • 4, and other phenacite-type compounds J. Appl. Phys. 53 1982 6817 6822
    • (1982) J. Appl. Phys. , vol.53 , pp. 6817-6822
    • Slack, G.A.1    Huseby, I.C.2
  • 11
    • 0021463798 scopus 로고
    • Precise determination of lattice parameter and thermal expansion coefficient of silicon between 300 and 1500 K
    • Y. Okada, and Y. Tokumaru Precise determination of lattice parameter and thermal expansion coefficient of silicon between 300 and 1500 K J. Appl. Phys. 56 1984 314 320
    • (1984) J. Appl. Phys. , vol.56 , pp. 314-320
    • Okada, Y.1    Tokumaru, Y.2
  • 13
    • 0019047567 scopus 로고
    • Elastic stiffness and thermal expansion coefficients of various refractory silicides and silicon nitride films
    • T.F. Retajczyk, and A.K. Sinha Elastic stiffness and thermal expansion coefficients of various refractory silicides and silicon nitride films Thin Solid Films 70 1980 241 247
    • (1980) Thin Solid Films , vol.70 , pp. 241-247
    • Retajczyk, T.F.1    Sinha, A.K.2
  • 14
    • 0032613383 scopus 로고    scopus 로고
    • Measurement of elastic modulus, poisson ratio, and coefficient of thermal expansion of on-wafer submicron films
    • J-H. Zhao, T. Ryan, P.S. Ho, A.J. McKerrow, and W-Y. Shih Measurement of elastic modulus, poisson ratio, and coefficient of thermal expansion of on-wafer submicron films J. Appl. Phys. 85 1999 6421 6424
    • (1999) J. Appl. Phys. , vol.85 , pp. 6421-6424
    • Zhao, J.-H.1    Ryan, T.2    Ho, P.S.3    McKerrow, A.J.4    Shih, W.-Y.5
  • 15
    • 33144481490 scopus 로고    scopus 로고
    • Modified Raman confinement model for Si nanocrystals
    • G. Faraci, S. Gibilisco, P. Russo, and A.R. Pennisi Modified Raman confinement model for Si nanocrystals Phys. Rev. B 73 2006 033307
    • (2006) Phys. Rev. B , vol.73 , pp. 033307
    • Faraci, G.1    Gibilisco, S.2    Russo, P.3    Pennisi, A.R.4
  • 17
    • 0343159124 scopus 로고    scopus 로고
    • Changes in the electronic properties of Si nanocrystals as a function of particle size
    • T.V. Buuren, L.N. Dinh, L.L. Chase, W.J. Siekhaus, and L.J. Terminello Changes in the electronic properties of Si nanocrystals as a function of particle size Phys. Rev. Lett. 80 1998 3803 3806
    • (1998) Phys. Rev. Lett. , vol.80 , pp. 3803-3806
    • Buuren, T.V.1    Dinh, L.N.2    Chase, L.L.3    Siekhaus, W.J.4    Terminello, L.J.5
  • 18
    • 0000332037 scopus 로고    scopus 로고
    • Correlation between luminescence and structural properties of Si nanocrystals
    • F. Iacona, G. Franzo, and C. Spinella Correlation between luminescence and structural properties of Si nanocrystals J. Appl. Phys. 87 2000 1295 1303
    • (2000) J. Appl. Phys. , vol.87 , pp. 1295-1303
    • Iacona, F.1    Franzo, G.2    Spinella, C.3
  • 20
    • 11944264362 scopus 로고
    • Light-induced redox reactions in nanocrystalline systems
    • A. Hagfeldt, and M. Grandtzel Light-induced redox reactions in nanocrystalline systems Chem. Rev. 95 1995 49 68
    • (1995) Chem. Rev. , vol.95 , pp. 49-68
    • Hagfeldt, A.1    Grandtzel, M.2
  • 21
    • 0141627855 scopus 로고    scopus 로고
    • Electronic structure and luminescence of 1.1- and 1.4-nm silicon nanocrystals: Oxide shell versus hydrogen passivation
    • Z. Zhou, L. Brus, and R. Friesner Electronic structure and luminescence of 1.1- and 1.4-nm silicon nanocrystals: oxide shell versus hydrogen passivation Nano Lett. 3 2003 163 167
    • (2003) Nano Lett. , vol.3 , pp. 163-167
    • Zhou, Z.1    Brus, L.2    Friesner, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.