메뉴 건너뛰기




Volumn 93, Issue 2, 2009, Pages 273-279

Synthesis and characterization of boron-doped Si quantum dots for all-Si quantum dot tandem solar cells

Author keywords

Boron; Dark resistivity; Doping; Silicon quantum dot; Solar cell

Indexed keywords

ACTIVATION ENERGY; BORON; CARRIER CONCENTRATION; DOPING (ADDITIVES); LIGHT EMISSION; LUMINESCENCE; MULTILAYER FILMS; NANOCRYSTALLINE ALLOYS; NONMETALS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; OPTICAL WAVEGUIDES; PHOTOELECTRON SPECTROSCOPY; PHOTOVOLTAIC CELLS; QUANTUM ELECTRONICS; SILICON; SILICON COMPOUNDS; SOLAR CELLS; SOLAR ENERGY; SOLAR EQUIPMENT; SYNTHESIS (CHEMICAL); X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 57649232797     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2008.10.017     Document Type: Article
Times cited : (130)

References (36)
  • 9
    • 0242332280 scopus 로고    scopus 로고
    • Synthesis and characterization of dilute magnetic semiconductor manganese-doped indium arsenide nanocrystals
    • Stowell C.A., Wiacek R.J., Saunders A.E., and Korgel B.A. Synthesis and characterization of dilute magnetic semiconductor manganese-doped indium arsenide nanocrystals. Nano Letters 3 (2003) 1441-1447
    • (2003) Nano Letters , vol.3 , pp. 1441-1447
    • Stowell, C.A.1    Wiacek, R.J.2    Saunders, A.E.3    Korgel, B.A.4
  • 10
    • 0033074945 scopus 로고    scopus 로고
    • Quenching of photoluminescence from Si nanocrystals caused by boron doping
    • Mimura A., Fujii M., Hayashi S., and Yamamoto K. Quenching of photoluminescence from Si nanocrystals caused by boron doping. Solid State Communications 109 (1999) 561-565
    • (1999) Solid State Communications , vol.109 , pp. 561-565
    • Mimura, A.1    Fujii, M.2    Hayashi, S.3    Yamamoto, K.4
  • 16
    • 0020870201 scopus 로고    scopus 로고
    • P. Antognetti, D.A. Antoniadis, R.W. Dutton, W.G. Oldham (Eds.), Process and Device Simulation for MOS-VLSI Circuits, in: NANO Advanced Study Institute Series, Series E: Applied Sciences, NO. 62, Martinus Nijhoff Publishers, Netherlands, 1983, pp. 230-234.
    • P. Antognetti, D.A. Antoniadis, R.W. Dutton, W.G. Oldham (Eds.), Process and Device Simulation for MOS-VLSI Circuits, in: NANO Advanced Study Institute Series, Series E: Applied Sciences, NO. 62, Martinus Nijhoff Publishers, Netherlands, 1983, pp. 230-234.
  • 17
    • 0038416243 scopus 로고
    • Ambient and dopant effects on boron diffusion in oxides
    • Wong C., and Lai F. Ambient and dopant effects on boron diffusion in oxides. Applied Physics Letters 48 (1986) 1658-1660
    • (1986) Applied Physics Letters , vol.48 , pp. 1658-1660
    • Wong, C.1    Lai, F.2
  • 18
    • 36549100879 scopus 로고
    • A pile-up phenomenon during arsenic diffusion in silicon-on-insulator structures formed by oxygen implantation
    • Normand P., Tsoukalas D., Guillemot N., and Chenevier P. A pile-up phenomenon during arsenic diffusion in silicon-on-insulator structures formed by oxygen implantation. Journal of Applied Physics 66 (1989) 3585-3589
    • (1989) Journal of Applied Physics , vol.66 , pp. 3585-3589
    • Normand, P.1    Tsoukalas, D.2    Guillemot, N.3    Chenevier, P.4
  • 19
    • 1542442507 scopus 로고    scopus 로고
    • Temperature coefficient of resistivity in heavily doped oxygen-rich polysilicon
    • Rydberg M., and Smith U. Temperature coefficient of resistivity in heavily doped oxygen-rich polysilicon. Journal of the Electrochemical Society 148 (2001) G725-G733
    • (2001) Journal of the Electrochemical Society , vol.148
    • Rydberg, M.1    Smith, U.2
  • 20
    • 0027530653 scopus 로고
    • Improved TEM samples of semiconductors prepared by a small-angle cleavage technique
    • McCaffrey J.P. Improved TEM samples of semiconductors prepared by a small-angle cleavage technique. Microscopy Research and Technique 24 (1993) 180-184
    • (1993) Microscopy Research and Technique , vol.24 , pp. 180-184
    • McCaffrey, J.P.1
  • 21
    • 57649165941 scopus 로고    scopus 로고
    • C.D. Wagner, W.M. Riggs, L.E. Davis, J.F. Moulder, G.E. Muilenberg (Eds.), Handbook of X-ray Photoelectron Spectroscopy, Perkin Elmer, Eden Prairie, MN, 1979, pp. 25-26.
    • C.D. Wagner, W.M. Riggs, L.E. Davis, J.F. Moulder, G.E. Muilenberg (Eds.), Handbook of X-ray Photoelectron Spectroscopy, Perkin Elmer, Eden Prairie, MN, 1979, pp. 25-26.
  • 22
    • 0002730950 scopus 로고
    • Compositional depth profiling by sputtering
    • Hofmann S. Compositional depth profiling by sputtering. Progress in Surface Science 36 (1991) 35-87
    • (1991) Progress in Surface Science , vol.36 , pp. 35-87
    • Hofmann, S.1
  • 23
    • 0018445029 scopus 로고
    • Influence of atomic mixing and preferential sputtering on depth profiles and interfaces
    • Liau Z.L., Tsaur B.Y., and Mayer J.W. Influence of atomic mixing and preferential sputtering on depth profiles and interfaces. Journal of Vacuum Science and Technology 16 (1979) 121-127
    • (1979) Journal of Vacuum Science and Technology , vol.16 , pp. 121-127
    • Liau, Z.L.1    Tsaur, B.Y.2    Mayer, J.W.3
  • 24
    • 6244271871 scopus 로고
    • Recoil mixing in solids by energetic ion beams
    • Littmark U., and Hofer W.O. Recoil mixing in solids by energetic ion beams. Nuclear Instruments & Methods 168 (1980) 329-342
    • (1980) Nuclear Instruments & Methods , vol.168 , pp. 329-342
    • Littmark, U.1    Hofer, W.O.2
  • 26
    • 0001677658 scopus 로고
    • Scherrer after sixty years: a survey and some new results in the determination of crystallite size
    • Langford J.I., and Wilson A.J.C. Scherrer after sixty years: a survey and some new results in the determination of crystallite size. Journal of Applied Crystallography 11 (1978) 102-113
    • (1978) Journal of Applied Crystallography , vol.11 , pp. 102-113
    • Langford, J.I.1    Wilson, A.J.C.2
  • 29
    • 0019602990 scopus 로고
    • The one phonon Raman spectrum in microcrystalline silicon
    • Richter H., Wang Z.P., and Ley L. The one phonon Raman spectrum in microcrystalline silicon. Solid State Communications 39 (1981) 625-629
    • (1981) Solid State Communications , vol.39 , pp. 625-629
    • Richter, H.1    Wang, Z.P.2    Ley, L.3
  • 31
    • 0033873579 scopus 로고    scopus 로고
    • Optimisation of doped microcrystalline silicon films deposited at very low temperatures by hot-wire CVD
    • Voz C., Peiro D., Bertomeu J., Soler D., Fonrodona M., and Andreu J. Optimisation of doped microcrystalline silicon films deposited at very low temperatures by hot-wire CVD. Materials Science and Engineering B 69-70 (2000) 278-283
    • (2000) Materials Science and Engineering B , vol.69-70 , pp. 278-283
    • Voz, C.1    Peiro, D.2    Bertomeu, J.3    Soler, D.4    Fonrodona, M.5    Andreu, J.6
  • 32
    • 36749076987 scopus 로고    scopus 로고
    • Phosphorous and boron doping of nc-Si:H thin films deposited on plastic substrates at 150 °C by hot-wire chemical vapor deposition
    • Filonovich S.A., Ribeiro M., Rolo A.G., and Alpuim P. Phosphorous and boron doping of nc-Si:H thin films deposited on plastic substrates at 150 °C by hot-wire chemical vapor deposition. Thin Solid Films 516 (2008) 576-579
    • (2008) Thin Solid Films , vol.516 , pp. 576-579
    • Filonovich, S.A.1    Ribeiro, M.2    Rolo, A.G.3    Alpuim, P.4
  • 34
    • 0020478369 scopus 로고
    • Contact resistance of polysilicon-silicon interconnections
    • Reeves G.K., and Harrison H.B. Contact resistance of polysilicon-silicon interconnections. Electronics Letters 18 (1982) 1083-1085
    • (1982) Electronics Letters , vol.18 , pp. 1083-1085
    • Reeves, G.K.1    Harrison, H.B.2
  • 35
    • 77956700032 scopus 로고    scopus 로고
    • Academic Press, New York pp. 303-305
    • Brus L. Semiconductors and Semimetals vol. 49 (1998), Academic Press, New York pp. 303-305
    • (1998) Semiconductors and Semimetals , vol.49
    • Brus, L.1
  • 36
    • 0030260463 scopus 로고    scopus 로고
    • Theory of radiative and nonradiative transitions for semiconductor nanocrystals
    • Lannoo M., Delerue C., and Allan G. Theory of radiative and nonradiative transitions for semiconductor nanocrystals. Journal of Luminescence 70 (1996) 170-184
    • (1996) Journal of Luminescence , vol.70 , pp. 170-184
    • Lannoo, M.1    Delerue, C.2    Allan, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.