Fabrication and characterization of tin-based nanocrystals

Journal of Applied Physics

Volumn 102, Issue 11, 2007, Pages

  Huang, Shujuan ^a   Cho, Eun Chel ^a   Conibeer, Gavin ^a   Green, Martin A ^a   Bellet, Daniel ^b   Bellet Amalric, Edith ^c   Cheng, Shuying ^d  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

^c CEA GRENOBLE   (France)

^d FUZHOU UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON COMPOUNDS; TIN; TRANSMISSION ELECTRON MICROSCOPY; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

COSPUTTERING; VACUUM ANNEALING;

NANOCRYSTALS;

EID: 37149012014     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2817902     Document Type: Article

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