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Volumn 85, Issue 9, 1999, Pages 6421-6424

Measurement of elastic modulus, Poisson ratio, and coefficient of thermal expansion of on-wafer submicron films

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; FINITE ELEMENT METHOD; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POISSON RATIO; SEMICONDUCTING GALLIUM ARSENIDE; SILANES; SILICA; SILICON WAFERS; STRESS ANALYSIS; THERMAL EFFECTS; THERMAL EXPANSION; THERMAL STRESS;

EID: 0032613383     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370146     Document Type: Article
Times cited : (120)

References (18)
  • 13
    • 0004242004 scopus 로고
    • EMIS Data reviews Ser. No. 2 The Institute of Electrical Engineers, London
    • INSPEC, Properties of Gallium Arsenide, EMIS Data reviews Ser. No. 2 (The Institute of Electrical Engineers, London, 1986).
    • (1986) Properties of Gallium Arsenide
  • 14
    • 85034182404 scopus 로고    scopus 로고
    • PhD. dissertation, University of Texas at Austin
    • I.-S. Yeo, PhD. dissertation, University of Texas at Austin, 1996.
    • (1996)
    • Yeo, I.-S.1
  • 18
    • 0041047463 scopus 로고    scopus 로고
    • Hibbitt, Karlsson, & Sorensen, Inc., Pawtucket, RI
    • ABAQUS 5.6 Standard User's Manual, Hibbitt, Karlsson, & Sorensen, Inc., Pawtucket, RI, 1996.
    • (1996) ABAQUS 5.6 Standard User's Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.