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Volumn 508, Issue 1, 2010, Pages 158-161
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Growth and characterization of nonpolar a-plane ZnO films on perovskite oxides with thin homointerlayer
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Author keywords
Characterization; Oxides; Physical vapor deposition processes
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Indexed keywords
A-PLANE;
CRYSTALLINE QUALITY;
HIGH GROWTH TEMPERATURES;
HIGH QUALITY;
NON-POLAR;
PEROVSKITE OXIDES;
PHOTOLUMINESCENCE SPECTRUM;
PHYSICAL VAPOR DEPOSITION PROCESSES;
RADIO-FREQUENCY-MAGNETRON SPUTTERING;
ROOM TEMPERATURE;
SRTIO;
ULTRA-THIN;
UV LIGHT;
ZNO;
ZNO BUFFER LAYER;
ZNO FILMS;
ZNO THIN FILM;
ATOMIC FORCE MICROSCOPY;
BUFFER LAYERS;
CRYSTALLINE MATERIALS;
FILM GROWTH;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
METALLIC FILMS;
PEROVSKITE;
PHOTOLUMINESCENCE;
PHYSICAL VAPOR DEPOSITION;
SURFACE ROUGHNESS;
THIN FILMS;
X RAY DIFFRACTION;
ZINC OXIDE;
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EID: 77957338116
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2010.08.037 Document Type: Article |
Times cited : (29)
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References (20)
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