SCOPUS 정보 검색 플랫폼

Volumn 103, Issue 7, 2008, Pages

Effect of ultrathin buffer on the microstructure of highly mismatched epitaxial ZnO films on Al2 O3 (0001)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL FILMS; MICROSTRUCTURAL EVOLUTION; ULTRATHIN FILMS; X RAY SCATTERING; ZINC OXIDE;

MICROSTRUCTURAL QUALITY; STRUCTURAL COHERENCE; ULTRATHIN BUFFER;

BUFFER LAYERS;

EID: 42149161102 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2905323 Document Type: Article

Times cited : (6)

References (10)

1
- 0037157438
- T. Nakamura, Y. Yamada, T. Kusumori, H. Minoura, and H. Muto, Thin Solid Films 411, 60 (2002).
- (2002) Thin Solid Films , vol.411 , pp. 60
- Nakamura, T.¹ Yamada, Y.² Kusumori, T.³ Minoura, H.⁴ Muto, H.⁵

2
- 0000632622
- Y. Chen, H. J. Ko, S. K. Hong, and T. Yao, Appl. Phys. Lett. 76, 559 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 559
- Chen, Y.¹ Ko, H.J.² Hong, S.K.³ Yao, T.⁴

3
- 0035890532
- F. Vigue, P. Vennegues, C. Deparis, S. Vezian, M. Laugt, and J. P. Faurie, J. Appl. Phys. 90, 5115 (2001).
- (2001) J. Appl. Phys. , vol.90 , pp. 5115
- Vigue, F.¹ Vennegues, P.² Deparis, C.³ Vezian, S.⁴ Laugt, M.⁵ Faurie, J.P.⁶

4
- 0038646291
- E. M. Kaidashev, M. Lorenz, H. von Wenckstern, A. Rahm, H. Hochmuth, and M. Grundmann, Appl. Phys. Lett. 82, 3901 (2003).
- (2003) Appl. Phys. Lett. , vol.82 , pp. 3901
- Kaidashev, E.M.¹ Lorenz, M.² Von Wenckstern, H.³ Rahm, A.⁴ Hochmuth, H.⁵ Grundmann, M.⁶

5
- 0010522057
- S. I. Park, T. S. Cho, S. J. Doh, J. L. Lee, and J. H. Je, Appl. Phys. Lett. 77, 349 (2000).
- (2000) Appl. Phys. Lett. , vol.77 , pp. 349
- Park, S.I.¹ Cho, T.S.² Doh, S.J.³ Lee, J.L.⁴ Je, J.H.⁵

6
- 0034205144
- I. Okubo, Y. Matsumoto, A. Ohtomo, T. Ohnishi, H. Koinuma, and M. Kawasaki, Appl. Surf. Sci. 159-160, 514 (2000).
- (2000) Appl. Surf. Sci. , vol.159-160 , pp. 514
- Okubo, I.¹ Matsumoto, Y.² Ohtomo, A.³ Ohnishi, T.⁴ Koinuma, H.⁵ Kawasaki, M.⁶

7
- 0000238112
- D. Y. Noh, Y. Ywu, H. K. Kim, and M. Hong, Phys. Rev. B 51, 4441 (1995).
- (1995) Phys. Rev. B , vol.51 , pp. 4441
- Noh, D.Y.¹ Ywu, Y.² Kim, H.K.³ Hong, M.⁴

8
- 0001367955
- P. M. Reimer, H. Zabel, C. P. Flynn, and J. A. Dura, Phys. Rev. B 45, 11426 (1992).
- (1992) Phys. Rev. B , vol.45 , pp. 11426
- Reimer, P.M.¹ Zabel, H.² Flynn, C.P.³ Dura, J.A.⁴

9
- 42149154262
- High Resolution X-Ray Diffractometry and Topography (Taylor & Francis, London).
- D. K. Bowen and B. K. Tanner, High Resolution X-Ray Diffractometry and Topography (Taylor & Francis, London, 1998).
- (1998)
- Bowen, D.K.¹ Tanner, B.K.²

10
- 42149124151
- Initial Stages of Epitaxial Growth, MRS Symposia Proceedings No. (Materials Research Society, Pittsburgh).
- R. Hull, J. M. Gibson, and D. A. Smith, Initial Stages of Epitaxial Growth, MRS Symposia Proceedings No. 94 (Materials Research Society, Pittsburgh, 1987).
- (1987) , vol.94
- Hull, R.¹ Gibson, J.M.² Smith, D.A.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.