Epitaxial thin films of hexagonal BaRuO3 on (001) SrTiO3

Applied Physics Letters

Volumn 78, Issue 3, 2001, Pages 329-331

  Lee, M K ^a   Eom, C B ^a   Lettieri, J ^b   Scrymgeour, I W ^b   Schlom, D G ^b   Tian, W ^c   Pan, X Q ^c   Ryan, P A ^d   Tsui, F ^d  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

^d UNIVERSITY OF NORTH CAROLINA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000538101     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1338965     Document Type: Article

References (13)

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9. Off-axis scans were carried out to determine the rotation relationship in the (022̄3) plane between the selected off-axis 4H reflections: 303̄0 and 033̄0, 101̄2 and 011̄2, and 202̄2 and 022̄2. The calculated angles between the planes based on 4H single crystal (Ref. 6) were 109.6° (or 70.4°), 121° (or 59°), and 97° (or 83°) in that order. These values were compared with the measured ones. This work makes the (022̄3) 4H phase distinguishable from other polymorphs such as 9R or pseudocubic.
10. W. Tian, X. Q. Pan, M. K. Lee, and C. B. Eom, Appl. Phys. Lett. 77, 1985 (2000).
11. 4H reflections were also found to be comparable.
12. M. K. Lee, C. B. Eom, W. Tian, X. Q. Pan, M. Smoak, F. Tsui, and J. J. Krajewski, Appl. Phys. Lett. 77, 364 (2000).
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