메뉴 건너뛰기




Volumn 54, Issue 12, 2010, Pages 1505-1510

Modelling and optimization of III/V transistors with matrices of nanowires

Author keywords

Field Effect Transistor; InAs; Nanowire; Ring oscillator; Wrap gate

Indexed keywords

ANALYTICAL MODEL; DIFFERENT STRUCTURE; INAS; IV CHARACTERISTICS; MATRIX; NANOWIRE TRANSISTORS; PARASITIC CAPACITANCE; PARASITIC COMPONENTS; PARASITICS; RING-OSCILLATOR; S -PARAMETERS; TRANSISTOR MODEL; TRANSISTOR PERFORMANCE; TRANSISTOR STRUCTURE; WRAP-GATE;

EID: 77957317458     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2010.06.017     Document Type: Article
Times cited : (2)

References (15)
  • 1
    • 0031079417 scopus 로고    scopus 로고
    • Scaling theory for cylindrical, fully-depleted, surrounding-gate MOSFET's
    • C.P. Auth, and J.D. Plummer Scaling theory for cylindrical, fully-depleted, surrounding-gate MOSFET's IEEE Electron Dev Lett 18 1997 74 76
    • (1997) IEEE Electron Dev Lett , vol.18 , pp. 74-76
    • Auth, C.P.1    Plummer, J.D.2
  • 3
    • 33749684169 scopus 로고    scopus 로고
    • Improved subthreshold slope in an InAs nanowire heterostructure field-effect transistor
    • E. Lind, A.I. Persson, L. Samuelson, and L.-E. Wernersson Improved subthreshold slope in an InAs nanowire heterostructure field-effect transistor Nano Lett 6 2006 1842 1846
    • (2006) Nano Lett , vol.6 , pp. 1842-1846
    • Lind, E.1    Persson, A.I.2    Samuelson, L.3    Wernersson, L.-E.4
  • 7
    • 33846090120 scopus 로고    scopus 로고
    • Analytical charge and capacitance models of undoped cylindrical surrounding-gate MOSFETs
    • J. Roig Analytical charge and capacitance models of undoped cylindrical surrounding-gate MOSFETs IEEE Trans Electron Dev 54 2007
    • (2007) IEEE Trans Electron Dev , vol.54
    • Roig, J.1
  • 8
    • 34249883957 scopus 로고    scopus 로고
    • Analytic carrier-based charge and capacitance model for long-channel undoped surrounding-gate MOSFETs
    • J. He, W. Bian, Y. Tao, S. Yang, and X. Tang Analytic carrier-based charge and capacitance model for long-channel undoped surrounding-gate MOSFETs IEEE Trans Electron Dev 54 2007
    • (2007) IEEE Trans Electron Dev , vol.54
    • He, J.1    Bian, W.2    Tao, Y.3    Yang, S.4    Tang, X.5
  • 12
    • 33845635729 scopus 로고    scopus 로고
    • An analytical fringe capacitance model for interconnects using conformal mapping
    • A. Bansal, B. Paul, and K. Roy An analytical fringe capacitance model for interconnects using conformal mapping IEEE Trans Comput-aided Des Integr Circuits Syst 25 2006 2765 2774
    • (2006) IEEE Trans Comput-aided des Integr Circuits Syst , vol.25 , pp. 2765-2774
    • Bansal, A.1    Paul, B.2    Roy, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.