메뉴 건너뛰기




Volumn 54, Issue 1, 2007, Pages 162-165

Analytical charge and capacitance models of undoped cylindrical surrounding-gate MOSFETs

Author keywords

Compact device modelling; Intrinsic capacitances; Surrounding gate (SGT) MOSFET

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC CHARGE; ELECTRIC CURRENTS; GATES (TRANSISTOR); MATHEMATICAL MODELS; POISSON EQUATION;

EID: 33846090120     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2006.887213     Document Type: Article
Times cited : (48)

References (10)
  • 1
    • 0024172246 scopus 로고
    • "High performance CMOS surrounding-gate transistor (SGT) for ultra-high density LSIs"
    • in Dec
    • H. Takato, K. Sunouchi, N. Okabe, A. Nitayama, F. Horiguchi, and F. Masuoka, "High performance CMOS surrounding-gate transistor (SGT) for ultra-high density LSIs," in IEDM Tech. Dig., Dec. 1988, pp. 222-225.
    • (1988) IEDM Tech. Dig. , pp. 222-225
    • Takato, H.1    Sunouchi, K.2    Okabe, N.3    Nitayama, A.4    Horiguchi, F.5    Masuoka, F.6
  • 3
    • 2442604614 scopus 로고    scopus 로고
    • "A comparative study of double-gate and surrounding-gate MOSFETs in strong inversion and accumulation using an analytical model"
    • Y. Chen and J. Luo, "A comparative study of double-gate and surrounding-gate MOSFETs in strong inversion and accumulation using an analytical model," in Proc. Int. Conf. Model. Simul. Microsyst., 2001, pp. 546-549.
    • (2001) Proc. Int. Conf. Model. Simul. Microsyst. , pp. 546-549
    • Chen, Y.1    Luo, J.2
  • 4
    • 0034258881 scopus 로고    scopus 로고
    • "Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs"
    • Sep
    • S.-H. Oh, D. Monroe, and J. M. Hergenrother, "Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs," IEEE Electron Device Lett., vol. 21, no. 9, pp. 445-447, Sep. 2000.
    • (2000) IEEE Electron Device Lett. , vol.21 , Issue.9 , pp. 445-447
    • Oh, S.-H.1    Monroe, D.2    Hergenrother, J.M.3
  • 8
    • 0018027059 scopus 로고
    • "A charge-oriented model for MOS transistor capacitances"
    • Oct
    • D. E. Ward and R. W. Dutton, "A charge-oriented model for MOS transistor capacitances," IEEE J. Solid-State Circuits, vol. SSC-13, no. 5, pp. 703-708, Oct. 1978.
    • (1978) IEEE J. Solid-State Circuits , vol.SSC-13 , Issue.5 , pp. 703-708
    • Ward, D.E.1    Dutton, R.W.2
  • 10
    • 0027886706 scopus 로고
    • "Quantum-mechanical effects on the threshold voltage of ultrathin-SOI NMOSFETs"
    • Dec
    • Y. Omura, S. Horiguchi, M. Tabe, and K. Kishi, "Quantum-mechanical effects on the threshold voltage of ultrathin-SOI NMOSFETs," IEEE Electron Device Lett., vol. 14, no. 12, pp. 569-571, Dec. 1993.
    • (1993) IEEE Electron Device Lett. , vol.14 , Issue.12 , pp. 569-571
    • Omura, Y.1    Horiguchi, S.2    Tabe, M.3    Kishi, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.