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Volumn 28, Issue 4, 2010, Pages 823-828

All-inorganic thermal nanoimprint process

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; AMORPHOUS FILMS; DEFECTS;

EID: 77957227761     PISSN: 21662746     EISSN: 21662754     Source Type: Journal    
DOI: 10.1116/1.3463454     Document Type: Conference Paper
Times cited : (15)

References (19)
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  • 6
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    • DOI 10.1021/nl050704c
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    • Goh, C.1    Coakley, K.M.2    McGehee, M.D.3
  • 15
    • 0031632795 scopus 로고    scopus 로고
    • ARMSCX 0084-6600,. 10.1146/annurev.matsci.28.1.153
    • Y. N. Xia and G. M. Whitesides, Annu. Rev. Mater. Sci. ARMSCX 0084-6600 28, 153 (1998). 10.1146/annurev.matsci.28.1.153
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    • THSFAP 0040-6090,. 10.1016/j.tsf.2009.07.056
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    • Ph.D. thesis, Oregon State University
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    • Meyers, S.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.