Helium atom diffraction measurements of the surface structure and vibrational dynamics of CH3 -Si (111) and CD3 -Si (111) surfaces

Journal of Chemical Physics

Volumn 133, Issue 10, 2010, Pages

  Becker, James S ^a   Brown, Ryan D ^a   Johansson, Erik ^b   Lewis, Nathan S ^b   Sibener, S J ^a  

^a UNIVERSITY OF CHICAGO   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DEPENDENCE; BENDING MODES; COLLISIONAL ENERGIES; DIFFUSE BACKGROUND; DYNAMICAL PROPERTIES; ELASTIC DIFFRACTION; HELIUM ATOM; HELIUM ATOM SCATTERING; LONG-RANGE ORDERING; LOW DEFECT DENSITIES; MEAN-SQUARE DISPLACEMENT; MOLECULAR MODE; SEMICONDUCTOR INTERFACES; SI (1 1 1); SURFACE TEMPERATURES; THERMAL MOTION; UNDERLAYERS; VIBRATIONAL DYNAMICS; WELL DEPTH;

ATOMS; DATA STORAGE EQUIPMENT; DEBYE TEMPERATURE; DEFECT DENSITY; DIFFRACTION PATTERNS; HELIUM; HOLOGRAPHIC INTERFEROMETRY; SILICON; SURFACE STRUCTURE;

CRYSTAL ATOMIC STRUCTURE;

HELIUM; ORGANOSILICON DERIVATIVE;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; ELECTRON ENERGY LOSS SPECTROSCOPY; INFRARED SPECTROSCOPY; MOLECULAR DYNAMICS; SURFACE PROPERTY; VIBRATION;

HELIUM; MOLECULAR DYNAMICS SIMULATION; MOLECULAR STRUCTURE; ORGANOSILICON COMPOUNDS; SPECTROSCOPY, ELECTRON ENERGY-LOSS; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SURFACE PROPERTIES; VIBRATION;

EID: 77956931671     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3483465     Document Type: Article

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