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Journal of Microscopy

Volumn 230, Issue 3, 2008, Pages 445-454

Using EBSD and TEM-Kikuchi patterns to study local crystallography at the domain boundaries of lead zirconate titanate

(7) Farooq, M U a Villaurrutia, R a MacLaren, I a Kungl, H b Hoffmann, M J b Fundenberger, J J c Bouzy, E c

a UNIVERSITY OF GLASGOW (United Kingdom)

b UNIVERSITY OF KARLSRUHE (Germany)

c UNIVERSITÉ PAUL VERLAINE METZ (France)

Author keywords

Domain wall; Electron backscatter diffraction; Ferroelectric; Kikuchi pattern; Lead zirconate titanate; Misorientation

Indexed keywords

FERROELECTRIC CERAMICS; FERROELECTRICITY; PEROVSKITE; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

90°-DOMAIN; DOMAIN BOUNDARY; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; FERROELECTRIC PEROVSKITES; KIKUCHI PATTERNS; LEAD ZIRCONATE TITANATE; LEAD ZIRCONATE-TITANATE; MISORIENTATION ANGLE; MISORIENTATIONS;

LEAD ZIRCONATE TITANATE;

LEAD; LEAD TITANATE ZIRCONATE; PEROVSKITE; TITANIUM; ZIRCONIUM;

AUTOMATION; CALCULATION; CERAMICS; CONFERENCE PAPER; CRYSTALLOGRAPHY; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON DIFFRACTION; IMAGE ANALYSIS; MATHEMATICAL ANALYSIS; MEASUREMENT; NOISE; PRIORITY JOURNAL; RELIABILITY; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 44349187530 PISSN: 00222720 EISSN: 13652818 Source Type: Journal
DOI: 10.1111/j.1365-2818.2008.02004.x Document Type: Conference Paper

Times cited : (19)

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