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Organic Electronics

Volumn 11, Issue 11, 2010, Pages 1729-1735

Local charge accumulation and trapping in grain boundaries of pentacene thin film transistors

(4) Yogev, S a Matsubara, R b Nakamura, M b Rosenwaks, Y a

a TEL AVIV UNIVERSITY (Israel)

b CHIBA UNIVERSITY (Japan)

Author keywords

Grain boundaries; Hole accumulation; Organic thin film transistors; Pentacene

Indexed keywords

GRAIN BOUNDARIES; SEMICONDUCTING ORGANIC COMPOUNDS; SILICA; THIN FILM TRANSISTORS; THIN FILMS;

CURRENT VOLTAGE MEASUREMENT; HOLE ACCUMULATION; KELVIN PROBE FORCE MICROSCOPY; ORGANIC THIN FILM TRANSISTORS; PENTACENE INTERFACE; PENTACENE THIN FILM TRANSISTORS; PENTACENE TRANSISTORS; PENTACENES;

THIN FILM CIRCUITS;

EID: 77956002212 PISSN: 15661199 EISSN: None Source Type: Journal
DOI: 10.1016/j.orgel.2010.07.021 Document Type: Article

Times cited : (34)

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