|
Volumn 93, Issue 4, 2008, Pages
|
Correlation between grain size and device parameters in pentacene thin film transistors
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHARGE TRAPPING;
CLARIFICATION;
CRYSTAL GROWTH;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
SEMICONDUCTING ORGANIC COMPOUNDS;
THICK FILMS;
THIN FILM DEVICES;
THIN FILM TRANSISTORS;
THIN FILMS;
TRANSISTORS;
CHANNEL MOBILITIES;
CHANNEL REGIONS;
CONTACT REGIONS;
CONTACT-RESISTANCE;
DEVICE PARAMETERS;
GENERAL APPROACH;
GRAIN SIZES;
GRAIN-SIZE DEPENDENCE;
LAYER INTERFACES;
METAL/ORGANIC INTERFACES;
PENTACENE THIN FILM TRANSISTORS;
GRAIN (AGRICULTURAL PRODUCT);
|
EID: 49149114497
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2967193 Document Type: Article |
Times cited : (104)
|
References (13)
|