Structural and electrical characterization of pentacene films on SiO 2 grown by molecular beam deposition

Thin Solid Films

Volumn 464-465, Issue , 2004, Pages 398-402

  Yanagisawa, Hirotomo ^a   Tamaki, Tsuyoshi ^a   Nakamura, Masakazu ^a   Kudo, Kazuhiro ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

AFM; Carrier mobility; Film morphology; Pentacene; TFT; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; GATES (TRANSISTOR); INTERFACES (MATERIALS); MOLECULAR BEAMS; MOLECULAR WEIGHT; MONOCHROMATORS; PHASE TRANSITIONS; SILICA; THIN FILM TRANSISTORS; X RAY DIFFRACTION;

FILM MORPHOLOGY; GRAIN MORPHOLOGY; MOLECULAR BEAM DEPOSITION; PENTACENE;

THIN FILMS;

EID: 4544238682     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.06.065     Document Type: Article

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