Microwave plasma nitridation of SrTiO3: A quantitative EELS, TEM, and STEM-HAADF analysis of the SrTiO3-xNy growth and the structural evolution

Crystal Growth and Design

Volumn 10, Issue 8, 2010, Pages 3562-3567

  Aguirre, Myriam H ^a   Shkabko, Andrey ^a   Weidenkaff, Anke ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LEVELS; CRYSTAL FORMATION; CRYSTALLOGRAPHIC SHEARS; ELEMENTAL MAPPING; ENERGY DISPERSIONS; HIGH CONCENTRATION; LAYER FORMATION; MICROWAVE PLASMA; NANO GRAINS; NANO-METER SCALE; NITROGEN INCORPORATION; PLANAR DEFECT; PLANAR FAULT; PLASMA TREATMENT; RUDDLESDEN-POPPER; SRTIO; STEM-HAADF; STRUCTURAL EVOLUTION; TEM; THREE-DIMENSIONAL NANOSTRUCTURES; TIO;

CRYSTAL ATOMIC STRUCTURE; DEFECTS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROWAVES; PLASMA APPLICATIONS; SINGLE CRYSTALS; STACKING FAULTS; STRONTIUM ALLOYS; TITANIUM NITRIDE; X RAY SPECTROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77955338478     PISSN: 15287483     EISSN: 15287505     Source Type: Journal    
DOI: 10.1021/cg100474x     Document Type: Article

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