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Volumn 108-109, Issue , 1998, Pages 217-224

Advances in the characterisation of multilayered coatings using electron energy loss spectroscopy in the transmission electron microscope

Author keywords

Electron energy loss near edge structure; Electron energy loss spectroscopy; ELNES; Multilayer nitride coatings; PEELS; TiN NbN multilayers; TiN Ti multilayers

Indexed keywords

ANNEALING; CERAMIC COATINGS; CRYSTALLOGRAPHY; DEPOSITION; ELECTRONIC STRUCTURE; EVAPORATION; HARDNESS; LATTICE CONSTANTS; PHASE INTERFACES; STRAIN; TITANIUM; TITANIUM NITRIDE;

EID: 0039774301     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(98)00559-3     Document Type: Article
Times cited : (10)

References (20)
  • 3
    • 0038855211 scopus 로고
    • in: B. Jouffrey, C. Colliex, J.P. Chevalier, F. Glas, P.W. Hawkes (Eds.), Les Editions de Physique, Les Ulis, France
    • C.P. Scott, A.J. Craven, P. Hatto, C. Davies, C.D. Wilkinson, in: B. Jouffrey, C. Colliex, J.P. Chevalier, F. Glas, P.W. Hawkes (Eds.), Proc. XIIIth ICEM, vol. 1, Les Editions de Physique, Les Ulis, France, 1994, p. 661.
    • (1994) Proc. XIIIth ICEM , vol.1 , pp. 661
    • Scott, C.P.1    Craven, A.J.2    Hatto, P.3    Davies, C.4    Wilkinson, C.D.5
  • 10
    • 0000669690 scopus 로고
    • in: J.N. Chapman, A.J. Craven (Eds.), SUSSP Publications, Edinburgh
    • C. Colliex, C. Mory, in: J.N. Chapman, A.J. Craven (Eds.), Quantitative Electron Microscopy, SUSSP Publications, Edinburgh, 1984, p. 149.
    • (1984) Quantitative Electron Microscopy , pp. 149
    • Colliex, C.1    Mory, C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.