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Volumn 172, Issue 2, 2010, Pages 187-190

Enhance of electrical properties of resistive switches based on Sr 0.1Ba0.9TiO3 and TiO2 thin films by employing a Ni-Cr alloy as contact

(4) Hernandez Rodriguez E a Marquez Herrera A a Melendez Lira M b Zapata Torres, M a

a INSTITUTO POLITÉCNICO NACIONAL (Mexico)

b DEPARTAMENTO DE FÍSICA (Mexico)

Author keywords

Electrical measurements; Metal insulator metal structures; Oxides; Sputtering

Indexed keywords

CHROMIUM ALLOYS; ELECTRIC FIELDS; ELECTRIC RESISTANCE; ELECTRODES; METAL INSULATOR BOUNDARIES; NICKEL ALLOYS; RRAM; SWITCHING; THIN FILMS; TITANIUM DIOXIDE;

CELL-BASED; ELECTRICAL MEASUREMENT; I-V MEASUREMENTS; METAL-INSULATOR-METAL STRUCTURES; NICHROME; RESISTANCE SWITCHING; RESISTIVE SWITCHES; SPUTTERING; SWITCHING PHENOMENON; TIO 2 THIN FILM;

BINARY ALLOYS;

EID: 77955308248 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/j.mseb.2010.05.017 Document Type: Article

Times cited : (5)

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