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Applied Physics Letters

Volumn 95, Issue 16, 2009, Pages

Microscopic origin of bipolar resistive switching of nanoscale titanium oxide thin films

(4) Jeong, Hu Young a Lee, Jeong Yong a Choi, Sung Yool b Kim, Jeong Won c

a Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

b Electronics and Telecommunications Research Institute (ETRI) (South Korea)

c Korea Research Institute of Standards and Science (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AL-METAL; ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY; DIRECT OBSERVATION; ENERGY-FILTERING TRANSMISSION ELECTRON MICROSCOPIES; IN-SITU; NANO SCALE; OXYGEN IONS; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; TITANIUM OXIDE LAYER; TITANIUM OXIDE THIN FILMS;

AIR FILTERS; ELECTRON MICROSCOPY; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; OXYGEN; SWITCHING; SWITCHING SYSTEMS; THIN FILMS; TITANIUM; TITANIUM OXIDES; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDE FILMS;

EID: 70350378210 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3251784 Document Type: Article

Times cited : (113)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.