Atomic force microscopy in structured liquids: Remark on the interpretation of jumps in force curves

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 252, Issue 2-3, 2005, Pages 165-168

  Butt, Hans Jürgen ^a   Stark, Rüdiger ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

Atomic force microscopy; Multilayers; Surfactant

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIOLOGICAL MEMBRANES; MULTILAYERS; SURFACE ACTIVE AGENTS; THICKNESS MEASUREMENT;

MOLECULAR LAYERS; STRUCTURED LIQUIDS; SURFACTANT LAYERS;

MOLECULAR STRUCTURE;

SURFACTANT;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; FORCE; LIQUID; MEASUREMENT; MEMBRANE; MICROSCOPE; MOLECULE; PRESSURE; PRIORITY JOURNAL; SOLVATION; THICKNESS;

EID: 11844304963     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2004.10.065     Document Type: Article

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