Resonant anomalous X-ray reflectivity as a probe of ion adsorption at solid-liquid interfaces

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5654-5659

  Fenter, Paul ^a   Park, Changyong ^a   Nagy, Kathryn L ^b   Sturchio, Neil C ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

Electrical double layer structure; Interfacial structure; Ion adsorption; Liquid solid interface; Resonant anomalous X ray reflectivity; X ray scattering

Indexed keywords

CARRIER CONCENTRATION; ELECTROLYTES; HYDRATION; ION SOURCES; REFLECTION; X RAY SCATTERING;

ELECTRICAL DOUBLE LAYER STRUCTURE; INTERFACIAL STRUCTURE; LIQUID SOLID INTERFACE; RESONANT ANOMALOUS X-RAY REFLECTIVITY;

INTERFACES (MATERIALS);

EID: 34247127448     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.118     Document Type: Article

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