Dithering-amplitude dependence of STM-regulated dynamic lateral force microscopy maps on Si (111 ) 7×7

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 19, 2009, Pages

  Sasaki, Naruo ^a   Kawai, Shigeki ^b,c   Kawakatsu, Hideki ^b  

^a SEIKEI UNIVERSITY   (Japan)

^b INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^c UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77954750356     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.193402     Document Type: Article

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