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Volumn 80, Issue 23, 2009, Pages

Relationship between resistive switching characteristics and band diagrams of Ti/Pr1-x CaxMnO3 junctions

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EID: 77954693097     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.235113     Document Type: Article
Times cited : (108)

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    • note
    • The c -axis lattice constants of the PCMO (x) films were evaluated from the (002) peaks of the films in XRD results. The XRD system (PANalytical) used in the experiments has a two-crystal monochromator and the measurement accuracy of a lattice constant is ± 0.0002 nm at diffraction angles θ = 45 - 49 ° where the (002) peak of the films appears.
  • 41


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