Colossal electroresistance of a Pr 0.7Ca 0.3MnO 3 thin film at room temperature

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 22, 2004, Pages

  Odagawa, A ^a,b   Sato, H ^a,c   Inoue, I H ^a   Akoh, H ^a,c   Kawasaki, M ^a,d   Tokura, Y ^a,e   Kanno, T ^b   Adachi, H ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b PANASONIC CORPORATION   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM DERIVATIVE; MANGANESE OXIDE;

ARTICLE; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTRODE; FILM; HYSTERESIS; ROOM TEMPERATURE; SEMICONDUCTOR;

EID: 84860077655     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.224403     Document Type: Article

References (20)

1. M. Imada, A. Fujimori, and Y. Tokura, Rev. Mod. Phys. 70, 1039 (1998).
2. S. Q. Liu, N. J. Wu, and A. Ignatiev, Appl. Phys. Lett. 76, 2749 (2000).
3. W. W. Zhuang, W. Pan, B. D. Ulrich, J. J. Lee, L. Stecker, A. Burmaster, D. R. Evans, S. T. Hsu, M. Tajiri, A. Shimaoka, K. Inoue, T. Naka, N. Awaya, K. Sakiyama, Y. Wang, S. Q. Liu, N. J. Wu, and A. Ignatiev, International Electron Devices Meeting, Technical Digest (Cat. No. 02CH37358) (IEEE, Piscataway, NJ, 2002), pp. 193-196.
4. A. Baikalov, Y. Q. Wang, B. Shen, B. Lorenz, S. Tsui, Y. Y. Sun, Y. Y. Xue, and C. W. Chu, Appl. Phys. Lett. 83, 957 (2003).
5. Y. Tomioka, A. Asamitsu, H. Kuwahara, Y. Moritomo, and Y. Tokura, Phys. Rev. B 53, R1689 (1996).
6. A. Asamitsu, Y. Tomioka, H. Kuwahara, and Y. Tokura, Nature (London) 388, 50 (1997).
7. J. Sakai, A. Kitagawa, and S. Imai, J. Appl. Phys. 90, 1410 (2001).
8. E. Dagotto, T. Hotta, and A. Moreo, Phys. Rep. 344, 1 (2001).
9. S. H. Pan, J. P. O'Neal, R. L. Badzey, C. Chamon, H. Ding, J. R. Engelbrecht, Z. Wang, H. Eisaki, S. Uchida, A. K. Gupta, K.-W. Ng, E. W. Hudson, K. M. Lang, and J. C. Davis, Nature (London) 413, 282 (2001).
10. M. A. Lampert and P. Mark, Current Injection in Solids (Academic Press, New York 1970).
11. We have also tried to analyze the experimental data using other models describing carrier transport in insulators such as Schottky, Poole-Frenkel, and Fowler-Nordheim models. However, our experimental data across the entire range of the current extending five orders of magnitude can be fitted only by the SCLC model.
12. S. C. Agarwal and H. Fritzsche, Phys. Rev. B 10, 4351 (1974).
13. A. Yelon, B. Movaghar, and H. M. Branz, Phys. Rev. B 46, 12 244 (1992).
14. M. J. Rozenberg, I. H. Inoue, and M. J. Sánchez, Phys. Rev. Lett. 92, 178302 (2004).
15. M. J. Rozenberg, I. H. Inoue, and M. J. Sánchez, cond-mat/0406646 (unpublished).
16. Similar behaviors were also discerned in our epitaxial PCMO films prepared by the pulsed-laser deposition technique.
17. I. Emmer, Thin Solid Films 20, 43 (1974).
18. A. Beck, J. G. Bednorz, Ch. Gerber, C. Rossel, and D. Widmer, Appl. Phys. Lett. 77, 139 (2000).
19. Y. Watanabe, J. G. Bednorz, A. Bietsch, Ch. Gerber, D. Widmer, A. Beck, and S. J. Wind, Appl. Phys. Lett. 78, 3738 (2001).
20. C. Rossel, G. I. Meijer, D. Brémaud, and D. Widmer, J. Appl. Phys. 90, 2892 (2001).