-
1
-
-
35348905767
-
Configurable isolation: Building high availability systems with commodity multi-core processors
-
Nidhi Aggarwal, Parthasarathy Ranganathan, Norman P. Jouppi, and James E. Smith. Configurable isolation: building high availability systems with commodity multi-core processors. SIGARCH Comput. Archit. News, 35(2), 2007.
-
(2007)
SIGARCH Comput. Archit. News
, vol.35
, Issue.2
-
-
Aggarwal, N.1
Ranganathan, P.2
Jouppi, N.P.3
Smith, J.E.4
-
2
-
-
0033321638
-
DIVA: A Reliable Substrate for Deep Submicron Microarchitecture Design
-
Todd Austin. DIVA: A Reliable Substrate For Deep Submicron Microarchitecture Design. Proceedings of the 32nd MICRO, 1999.
-
Proceedings of the 32nd MICRO, 1999
-
-
Austin, T.1
-
3
-
-
49549119735
-
Reliable Systems on Unreliable Fabrics
-
Todd Austin, V. Bertacco, S. Mahlke, and Yu Cao. Reliable Systems on Unreliable Fabrics. IEEE Des. Test, 25(4), 2008.
-
(2008)
IEEE Des. Test
, vol.25
, Issue.4
-
-
Austin, T.1
Bertacco, V.2
Mahlke, S.3
Cao, Y.4
-
4
-
-
27544473955
-
Nonstop R advanced architecture
-
D. Bernick, B. Bruckert, P. D. Vigna, D. Garcia, R. Jardine, J. Klecka, and J. Smullen. Nonstop R advanced architecture. In DSN '05: Proc. of DSN, 2005.
-
DSN '05: Proc. of DSN, 2005
-
-
Bernick, D.1
Bruckert, B.2
Vigna, P.D.3
Garcia, D.4
Jardine, R.5
Klecka, J.6
Smullen, J.7
-
5
-
-
33846118079
-
Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation
-
S. Y. Borkar. Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation. IEEE Micro, 25(6), 2005.
-
(2005)
IEEE Micro
, vol.25
, Issue.6
-
-
Borkar, S.Y.1
-
6
-
-
4043157227
-
Reliability, Availability, and Serviceability (RAS) of the IBM eServer z990
-
M.L. Fair, C.R. Conklin, S. B. Swaney, P. J. Meaney, W. J. Clarke, L. C. Alves, I. N. Modi, F. Freier, W. Fischer, and N. E. Weber. Reliability, Availability, and Serviceability (RAS) of the IBM eServer z990. IBM Journal of Research and Development, 2004.
-
(2004)
IBM Journal of Research and Development
-
-
Fair, M.L.1
Conklin, C.R.2
Swaney, S.B.3
Meaney, P.J.4
Clarke, W.J.5
Alves, L.C.6
Modi, I.N.7
Freier, F.8
Fischer, W.9
Weber, N.E.10
-
8
-
-
36949001469
-
An Analysis of Efficient Multi-Core Global Power Management Policies: Maximizing Performance for a Given Power Budget
-
C. Isci, A. Buyuktosunoglu, C-Y. Cher, P. Bose, and M. Martonosi. An Analysis of Efficient Multi-Core Global Power Management Policies: Maximizing Performance for a Given Power Budget. Proc. of the 39th MICRO, 2006.
-
Proc. of the 39th MICRO, 2006
-
-
Isci, C.1
Buyuktosunoglu, A.2
Cher, C.-Y.3
Bose, P.4
Martonosi, M.5
-
10
-
-
57749178620
-
System level analysis of fast, per-core DVFS using on-chip switching regulators
-
W. Kim, M. S. Gupta, Wei Gu-Yeon, and D. Brooks. System level analysis of fast, per-core DVFS using on-chip switching regulators. Proceedings of the 14th HPCA, 2008.
-
Proceedings of the 14th HPCA, 2008
-
-
Kim, W.1
Gupta, M.S.2
Gu-Yeon, W.3
Brooks, D.4
-
13
-
-
77956594813
-
OpenSPARC: An Open Platform for Hardware Reliability Experimentation
-
I. Parulkar, A. Wood, J. C. Hoe, B. Falsafi, S. V. Adve, and J. Torrellas. OpenSPARC: An Open Platform for Hardware Reliability Experimentation. Fourth Workshop on Silicon Errors in Logic-System Effects (SELSE), 2008.
-
Fourth Workshop on Silicon Errors in Logic-System Effects (SELSE), 2008
-
-
Parulkar, I.1
Wood, A.2
Hoe, J.C.3
Falsafi, B.4
Adve, S.V.5
Torrellas, J.6
-
16
-
-
33644879118
-
-
J. Renau, B. Fraguela, J. Tuck, W. Liu, M. Prvulovic, L. Ceze, S. Sarangi, P. Sack, K. Strauss, and P. Montesinos. SESC Simulator. http://sesc.sourceforge.net/, 2005.
-
(2005)
SESC Simulator
-
-
Renau, J.1
Fraguela, B.2
Tuck, J.3
Liu, W.4
Prvulovic, M.5
Ceze, L.6
Sarangi, S.7
Sack, P.8
Strauss, K.9
Montesinos, P.10
-
17
-
-
0032597692
-
AR-SMT: A Microarchitectural Approach to Fault Tolerance in a Microprocessor
-
E. Rotenberg. AR-SMT: A Microarchitectural Approach to Fault Tolerance in a Microprocessor. Proceedings of FTCS, 1999.
-
Proceedings of FTCS, 1999
-
-
Rotenberg, E.1
-
18
-
-
0036931372
-
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
-
P. Shivakumar, M. Kistler, S. Keckler, D. Burger, and L. Alvisi. Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic. Proceedings of the 32nd DSN, 2002.
-
Proceedings of the 32nd DSN, 2002
-
-
Shivakumar, P.1
Kistler, M.2
Keckler, S.3
Burger, D.4
Alvisi, L.5
-
19
-
-
12844278588
-
Fingerprinting: Bounding soft error detection latency and bandwidth
-
J. C. Smolens, B. T. Gold, J. Kim, B. Falsafi, J. C. Hoe, and A. G. Nowatzyk. Fingerprinting: Bounding soft error detection latency and bandwidth. Proceedings of the 9th ASPLOS, 2004.
-
Proceedings of the 9th ASPLOS, 2004
-
-
Smolens, J.C.1
Gold, B.T.2
Kim, J.3
Falsafi, B.4
Hoe, J.C.5
Nowatzyk, A.G.6
-
22
-
-
77953101372
-
Mulitplexed Redundant Execution: A Technique for Efficient Fault Tolerance in Chip Multiprocessors
-
P. Subramanyan, V. Singh, K. K. Saluja, and E. Larsson. Mulitplexed Redundant Execution: A Technique for Efficient Fault Tolerance in Chip Multiprocessors. Proc. of DATE, 2010.
-
Proc. of DATE, 2010
-
-
Subramanyan, P.1
Singh, V.2
Saluja, K.K.3
Larsson, E.4
-
23
-
-
77956573875
-
Energy-Efficient Fault Tolerance in Chip Multiprocessors Using Critical Value Forwarding
-
To appear
-
P. Subramanyan, V. Singh, K. K. Saluja, and E. Larsson. Energy-Efficient Fault Tolerance in Chip Multiprocessors Using Critical Value Forwarding. To appear in Proc. of DSN, 2010.
-
Proc. of DSN, 2010
-
-
Subramanyan, P.1
Singh, V.2
Saluja, K.K.3
Larsson, E.4
|