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Volumn 5, Issue , 2010, Pages 319-326

Recrystallization of lead free solder joints - confounding the interpretation of accelerated thermal cycling results?

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; FAILURE (MECHANICAL); FATIGUE DAMAGE; LEAD-FREE SOLDERS; RECRYSTALLIZATION (METALLURGY); SOLDERED JOINTS; TEXTURES; THERMAL EXPANSION;

EID: 77954282803     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2009-12749     Document Type: Conference Paper
Times cited : (8)

References (27)
  • 1
    • 85196938103 scopus 로고    scopus 로고
    • www.aciusa.org
  • 2
    • 85196974236 scopus 로고    scopus 로고
    • Borgesen, P., et al., in preparation
    • Borgesen, P., et al., in preparation
  • 3
    • 77955184798 scopus 로고    scopus 로고
    • Effect of dwell time on the life of lead free bga joints in thermal cycling
    • P. Borgesen, M. Meilunas, and E. Al-Momani, 2009, "Effect of Dwell Time on the Life of Lead Free BGA Joints in Thermal Cycling", Proc. SMTAI2009
    • (2009) Proc. SMTAI2009
    • Borgesen, P.1    Meilunas, M.2    Al-Momani, E.3
  • 5
    • 85115243338 scopus 로고
    • Cumulative damage in fatigue
    • Trans. ASME Vol. 67
    • Miner, M. A. 1945, "Cumulative Damage in Fatigue". Journal of Applied Mechanics, Vol. 12, Trans. ASME Vol. 67, pp. A159-A164.
    • (1945) Journal of Applied Mechanics , vol.12
    • Miner, M.A.1
  • 7
    • 68349127736 scopus 로고    scopus 로고
    • An incremental damage superposition approach for interconnect reliability under combined accelerated stresses
    • Dallas, November 1997
    • Upadhyayula, K., and Dasgupta, A. 1997, "An Incremental Damage Superposition Approach for Interconnect Reliability Under Combined Accelerated Stresses", ASME International Mechanical Engineering Congress & Exposition, Dallas, November 16-21, 1997.
    • (1997) ASME International Mechanical Engineering Congress & Exposition , pp. 16-21
    • Upadhyayula, K.1    Dasgupta, A.2
  • 8
    • 85196957864 scopus 로고    scopus 로고
    • Design of experiments for board level solder joint reliability of pbga package under various manufacturing and multiple environmental loading conditions
    • Qi, H., Osterman, M., and Pecht, M. 2007, "Design of Experiments for Board Level Solder Joint Reliability of PBGA Package under Various Manufacturing and Multiple Environmental Loading Conditions", IEEE Transactions on Electronics Packaging Manufacturing.
    • (2007) IEEE Transactions on Electronics Packaging Manufacturing
    • Qi, H.1    Osterman, M.2    Pecht, M.3
  • 10
    • 46149143690 scopus 로고    scopus 로고
    • Recrystallization principles applied to whisker growth in tin
    • Anaheim, CA: March 31
    • Boguslavsky, I. and Bush, P. 2003, "Recrystallization Principles Applied to Whisker Growth in Tin," APEX 2003, Anaheim, CA: March 31, pp. S12-4-1 - S12-4-10.
    • (2003) APEX 2003
    • Boguslavsky, I.1    Bush, P.2
  • 12
    • 33947596419 scopus 로고    scopus 로고
    • Isothermal fatigue behaviour of the near-eutectic Sn-Ag-Cu alloy between -25-125°C
    • Korhonen, T.K., Lehman, L., Korhonen, M.A., and Henderson, D.W. 2007. Isothermal fatigue behaviour of the near-eutectic Sn-Ag-Cu alloy between -25-125°C Journal of electronic materials. 36(2), pp. 173-178.
    • (2007) Journal of Electronic Materials , vol.36 , Issue.2 , pp. 173-178
    • Korhonen, T.K.1    Lehman, L.2    Korhonen, M.A.3    Henderson, D.W.4
  • 13
    • 51349119304 scopus 로고    scopus 로고
    • The effect of sn grain number and orientation on the shear fatigue life of SnAgCu solder Joints
    • Arfaei, B., Xing, Y., Woods, J., Wolcott, J., Tumne, P. Borgesen, P., and Cotts, E. 2008, "The Effect of Sn Grain Number and Orientation on the Shear Fatigue Life of SnAgCu Solder Joints", Proc. ECTC 2008, 459-465
    • (2008) Proc. ECTC 2008 , pp. 459-465
    • Arfaei, B.1    Xing, Y.2    Woods, J.3    Wolcott, J.4    Tumne, P.5    Borgesen, P.6    Cotts, E.7
  • 15
    • 0942299492 scopus 로고    scopus 로고
    • Effects of mechanical deformation and annealing on the microstructure and hardness of Pb-Free solders
    • Lauro, P. Kang, S.K. Choi, W.K. and Shin, D.Y. 2003. "Effects of Mechanical Deformation and Annealing on the Microstructure and Hardness of Pb-Free Solders". Journal of Electronic materials 32(12), pp. 1432-1440.
    • (2003) Journal of Electronic Materials , vol.32 , Issue.12 , pp. 1432-1440
    • Lauro, P.1    Kang, S.K.2    Choi, W.K.3    Shin, D.Y.4
  • 16
    • 2942755822 scopus 로고    scopus 로고
    • Recrystallization of Sn grains due to thermal strain in Sn-1.2Ag-0.5Cu-0.05Ni Solder
    • Terashima, S., Takahama, K., Nozaki, M., and Tanaka, M. 2004, "Recrystallization of Sn Grains due to Thermal Strain in Sn-1.2Ag-0.5Cu-0.05Ni Solder". Materials Transactions, 45 (4), pp. 1383-1390.
    • (2004) Materials Transactions , vol.45 , Issue.4 , pp. 1383-1390
    • Terashima, S.1    Takahama, K.2    Nozaki, M.3    Tanaka, M.4
  • 17
    • 33644921774 scopus 로고    scopus 로고
    • Reliability of lead-free interconnections under consecutive thermal and mechanical loadings
    • Mattila, T.T., and Kivilahti, J.K. 2006, "Reliability of Lead-Free Interconnections under Consecutive Thermal and Mechanical Loadings". Journal of Electronic materials 35 (2), pp. 250-256.
    • (2006) Journal of Electronic Materials , vol.35 , Issue.2 , pp. 250-256
    • Mattila, T.T.1    Kivilahti, J.K.2
  • 18
    • 18844425254 scopus 로고    scopus 로고
    • Microstructural features contributing to enhanced behaviour of Sn-Ag based solder joints
    • Lee, J.G., and Subramanian, K.N., 2005. "Microstructural features contributing to enhanced behaviour of Sn-Ag based solder joints". Soldering and surface mount technology 17(1), pp.33-39
    • (2005) Soldering and Surface Mount Technology , vol.17 , Issue.1 , pp. 33-39
    • Lee, J.G.1    Subramanian, K.N.2
  • 19
    • 34249676924 scopus 로고    scopus 로고
    • Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests
    • Laurila, T. Mattila, T. Vuorinen, V. Karppinen, J. Li, J. Sippola, M. and Kivilahti, J.K. 2007, "Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests". Microelectronics Reliability 47, pp. 1135-1144.
    • (2007) Microelectronics Reliability , vol.47 , pp. 1135-1144
    • Mattila, L.T.1    Vuorinen, T.2    Karppinen, V.3    Li, J.4    Sippola M, J.5    Kivilahti, J.K.6
  • 20
    • 40549092804 scopus 로고    scopus 로고
    • An acceleration model for Sn-Ag-Cu solder joint reliability under various thermal cycle conditions
    • Sep. 2005 Chicago, IL
    • Pan, N. Henshall, G. A. Billaut, F. Dai, S. Strum, M. J. Lweis, R. Benedetto, E. and Rayner, J. 2005, "An Acceleration Model for Sn-Ag-Cu Solder Joint Reliability under Various Thermal Cycle Conditions", Proc. SMTA Int. (Sep. 2005) Chicago, IL, pp. 876-883
    • (2005) Proc. SMTA Int. , pp. 876-883
    • Henshall, P.N.1    Billaut, G.A.2    Dai, F.3    Strum, S.4    Lweis, M.J.5    Benedetto E, R.6    Rayner, J.7
  • 21
    • 51349135927 scopus 로고    scopus 로고
    • An acceleration model for lead-free (SAC) solder joint reliability under thermal cycling
    • Vasudevan, V. and Fan, X. 2008, "An Acceleration Model for Lead-Free (SAC) Solder Joint Reliability under Thermal Cycling", Proc. ECTC 2008, pp. 139-145
    • (2008) Proc. ECTC 2008 , pp. 139-145
    • Vasudevan, V.1    Fan, X.2
  • 22
    • 33845585090 scopus 로고    scopus 로고
    • A strain range based model for life assessment of Pb-free SAC solder interconnects
    • Osterman, M. Dasgupta, A. and Han, B. 2006, "A Strain Range Based Model for Life Assessment of Pb-free SAC Solder Interconnects", Proc. ECTC 2006, pp. 884-890
    • (2006) Proc. ECTC 2006 , pp. 884-890
    • Osterman, M.1    Dasgupta, A.2    Han, B.3
  • 24
    • 70349693675 scopus 로고    scopus 로고
    • Accelerating the effects of aging on the reliability of lead free solder joints in a quantitative fashion
    • V. Venkatadri, Yin, L. Xing, Y. Cotts, E. Srihari, K. and Borgesen, P. 2009, "Accelerating the Effects of Aging on the Reliability of Lead Free Solder Joints in a Quantitative Fashion, Proc. ECTC 2009
    • (2009) Proc. ECTC 2009
    • Venkatadri, V.1    Xing, Y.L.2    Cotts, Y.3    Srihari K, E.4    Borgesen, P.5
  • 25
    • 85196952454 scopus 로고    scopus 로고
    • L. Yin et al., in preparation
    • L. Yin et al., in preparation


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.