Mechanisms of low noise and high detectivity of p-GaN/i-ZnO/n-ZnO: Al-heterostructured ultraviolet photodetectors

IEEE Photonics Technology Letters

Volumn 22, Issue 15, 2010, Pages 1117-1119

  Lee, Ching Ting ^a   Lin, Tzu Shun ^a   Lee, Hsin Ying ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Detectivity; flicker noise; noise equivalent power; thermal noise; ZnO based ultraviolet (UV) photodetectors

Indexed keywords

DETECTIVITY; FLICKER NOISE; NOISE EQUIVALENT POWER; ULTRA-VIOLET; ZNO;

ALUMINUM; GALLIUM NITRIDE; METALLIC FILMS; OPTOELECTRONIC DEVICES; PHOTODETECTORS; THERMAL NOISE;

ZINC OXIDE;

EID: 77954271883     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2010.2050473     Document Type: Article

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