Identifying diversity in nanoscale electrical break junctions

Journal of the American Chemical Society

Volumn 132, Issue 26, 2010, Pages 9157-9164

  Martín, Santiago ^a,d   Grace, Iain ^b   Bryce, Martin R ^c   Wang, Changsheng ^c   Jitchati, Rukkiat ^c,e   Batsanov, Andrei S ^c   Higgins, Simon J ^a   Lambert, Colin J ^b   Nichols, Richard J ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b LANCASTER UNIVERSITY   (United Kingdom)

^c DURHAM UNIVERSITY   (United Kingdom)

^d UNIVERSITY OF ZARAGOZA   (Spain)

^e UBON RATCHATHANI UNIVERSITY   (Thailand)

Author keywords

[No Author keywords available]

Indexed keywords

BREAK JUNCTIONS; CHEMICAL CONTROLS; ELECTRICAL PROPERTY; FLOWTHROUGH; METAL JUNCTIONS; METAL SURFACES; MOLECULAR-SCALE ELECTRONIC DEVICE; NANO SCALE; NOVEL STRATEGIES; OLIGOPHENYLENEETHYNYLENES; PHENYL RINGS; SINGLE MOLECULE LEVEL; STACKED JUNCTIONS;

ELECTRIC PROPERTIES; MOLECULES; STRATEGIC PLANNING;

METALS;

ETHYLENE DERIVATIVE; METAL NANOPARTICLE; PHENYL GROUP; THIOL DERIVATIVE;

ARTICLE; CONJUGATION; ELECTRIC CONDUCTIVITY; ELECTRON; MOLECULAR INTERACTION; MOLECULE; SUPRAMOLECULAR CHEMISTRY; SURFACE PROPERTY; SYNTHESIS;

EID: 77954253363     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja103327f     Document Type: Article

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