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Volumn 247, Issue 6, 2010, Pages 1322-1334

Periodically arranged Si nanostructures by glancing angle deposition on patterned substrates

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[No Author keywords available]

Indexed keywords


EID: 77954167702     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200945526     Document Type: Article
Times cited : (33)

References (35)
  • 4
    • 77954173361 scopus 로고    scopus 로고
    • Sculptured Thin Films: Nanoengineered Morphology and Optics (SPIE Press, Bellingham, WA, USA.)
    • A. Lakhtakia and R. Messier, Sculptured Thin Films: Nanoengineered Morphology and Optics (SPIE Press, Bellingham, WA, USA, 2005.).
    • (2005)
    • Lakhtakia, A.1    Messier, R.2
  • 8
    • 0035843911 scopus 로고    scopus 로고
    • O. Toader and S. John, Science 292(5519), 1133 (2001).
    • (2001) Science , vol.292 , Issue.5519 , pp. 1133
    • Toader, O.1    John, S.2
  • 24
    • 77954149758 scopus 로고    scopus 로고
    • SPIP, The scanning probe image processor, image metrology
    • SPIP, The scanning probe image processor, image metrology. www.imagemet.com.
  • 25
    • 0003787853 scopus 로고    scopus 로고
    • Characterization of Amorphous and Crystalline Rough Surfaces
    • (Academic Press, San Diego.)
    • Y. Zhao, G. C. Wang, and T. M. Lu, Characterization of Amorphous and Crystalline Rough Surfaces: Principles and Applications (Academic Press, San Diego, 2001).
    • (2001) Principles and Applications
    • Zhao, Y.1    Wang, G.C.2    Lu, T.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.