Growth, microstructure, and infrared-ultraviolet optical conductivity of La0.5Sr0.5CoO3 nanocrystalline films on silicon substrates by pulsed laser deposition

ACS Applied Materials and Interfaces

Volumn 2, Issue 3, 2010, Pages 896-902

  Li, W W ^a   Hu, Z G ^a   Li, Y W ^a   Zhu, M ^b   Zhu, Z Q ^a   Chu, J H ^a  

^a EAST CHINA NORMAL UNIVERSITY   (China)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Dielectric functions; La0.5Sr0.5CoO3; Optical properties; Spectroscopic ellipsometry

Indexed keywords

COLUMNAR GROWTH; CRYSTALLINE STRUCTURE; DIELECTRIC FUNCTIONS; DIFFERENT SUBSTRATES; EXPERIMENTAL DATA; FUTURE APPLICATIONS; LA0.5SR0.5COO3; LORENTZ OSCILLATOR MODEL; METALLIC PHASE; NANO-CRYSTALLINE STRUCTURES; NANOCRYSTALLINE FILMS; NANOCRYSTALLINES; NEAR INFRARED REGION; PHOTON ENERGY RANGE; POLYCRYSTALLINE; PURE PEROVSKITE PHASE; REAL PART; SILICON SUBSTRATES; SPIN-ELECTRONIC DEVICES; SUBSTRATE TEMPERATURE; ULTRAVIOLET OPTICAL PROPERTIES;

COBALT COMPOUNDS; LANTHANUM; NANOCRYSTALLINE SILICON; OPTICAL CONDUCTIVITY; OXIDE MINERALS; PEROVSKITE; PULSED LASER DEPOSITION; PULSED LASERS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE STRUCTURE; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

SUBSTRATES;

EID: 77953884515     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am900868a     Document Type: Article

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